- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄382359 > NL322522T-101J (TDK Corporation) DBMM25P PDF資料下載
參數(shù)資料
| 型號(hào)： | NL322522T-101J |
| 廠商： | TDK Corporation |
| 英文描述： | DBMM25P |
| 中文描述： | 貼片 |
| 文件頁(yè)數(shù)： | 4/4頁(yè) |
| 文件大?。?/td> | 119K |
| 代理商： | NL322522T-101J |
511_NL3225
980330
All specifications are subject to change without notice.
Specifications which provide more details for the proper and safe use of the described product are available upon request.
Inductors
For General Applications
SMD
NL Series NL3225 Type
TYPICAL ELECTRICAL CHARACTERISTICS
IMPEDANCE vs. FREQUENCY CHARACTERISTICS
INDUCTANCE CHANGE vs. TEMPERATURE
CHARACTERISTICS
Q vs. FREQUENCY CHARACTERISTICS
0.5
5
10
50
100
500
1000
1
10
5
100
1000
50
500
I
)
Frequency(MHz)
0.1
μ
H
0.047
μ
H
0.022
μ
H
0.01
μ
H
Test equipment:
RF IMPEDANCE ANALYZER 4191A, YHP
100
μ
H
220
μ
H
10
μ
H
1
μ
H
Frequency(MHz)
0.1
100
50
1k
10k
5k
500
100k
50k
1
0.5
10
5
40
I
)
4194A IMPEDANCE/GAIN-PHASE
ANALYZER
8.2
μ
H
33
μ
H
100
μ
H
80
100
μ
H
3.3
μ
H
8.2
μ
H
–40
–20
0
20
40
60
Temperature(°C)
L
2
(
Test equipment:
LCR model-4275A, YHP
at 10kHz 1Vrms
5
–5
0.022
μ
H
0.01
μ
H
0.047
μ
H
0.1
μ
H
0.5
5
10
50
100
500
1000
1
10
5
100
1000
50
500
Q
Frequency(MHz)
Test equipment:
RF IMPEDANCE ANALYZER 4191A, YHP
0.1
0.05
1
0.5
Frequency(MHz)
10
5
0
20
40
60
80
100
Q
2.2
μ
H
4.7
μ
H
10
μ
H
68
μ
H
100
μ
H
220
μ
H
Test equipment:Q meter model-4343B, YHP
33
μ
H
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| NL322522T-120J | SMD |
| NL322522T-121J | SMD |
| NL322522T-150J | SMD |
| NL322522T-151J | SMD |
| NL322522T-180J | SMD |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| NL322522T-101J-N | 制造商:Yageo 功能描述:Ind Chip Wirewound 100uH 5% 796KHz 20Q-Factor Ferrite 40mA 1210 T/R |
| NL322522T-101K-3 | 制造商:TDK 功能描述:Inductor, Thin Film, 100uh, 10±% |
| NL322522T-120J | 制造商:TDK 功能描述: |
| NL322522T-121J | 制造商:TDK 功能描述: 制造商:TDK 功能描述:Ind RF Chip Wirewound 120uH 5% 796KHz 20Q-Factor 70mA 1210 T/R |
| NL322522T-150J | 制造商:TDK 制造商全稱:TDK Electronics 功能描述:SMD |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。