- 鎮ㄧ従(xi脿n)鍦ㄧ殑浣嶇疆锛�璨疯常IC缍�(w菐ng) > PDF鐩寗9457 > NBXSBA051LN1TAG (ON Semiconductor)IC XO LVPECL 533.3333MHZ 6CLCC PDF璩囨枡涓嬭級
鍙冩暩(sh霉)璩囨枡
| 鍨嬭櫉锛� | NBXSBA051LN1TAG |
| 寤犲晢锛� | ON Semiconductor |
| 鏂囦欢闋佹暩(sh霉)锛� | 3/6闋� |
| 鏂囦欢澶�?銆�?/td> | 0K |
| 鎻忚堪锛� | IC XO LVPECL 533.3333MHZ 6CLCC |
| 妯欐簴鍖呰锛� | 1,000 |
| 绯诲垪锛� | PureEdge™ |
| 椤炲瀷锛� | 鎸暕鍣� - 鏅堕珨 |
| 闋荤巼锛� | 533.33MHz |
| 闆绘簮闆诲锛� | 2.375 V ~ 3.63 V |
| 闆绘祦 - 闆绘簮锛� | 95mA |
| 宸ヤ綔婧害锛� | -40°C ~ 85°C |
| 灏佽/澶栨锛� | * |
| 鍖呰锛� | * |
| 渚涙噳鍟嗚ō鍌欏皝瑁濓細 | * |
| 瀹夎椤炲瀷锛� | * |
NBXSBA051
http://onsemi.com
3
Symbol
Characteristic
Conditions
Min.
Typ.
Max.
Units
IDD
Power Supply Current
95
105
mA
VIH
OE Input HIGH Voltage
2000
VDD
mV
VIL
OE Input LOW Voltage
GND 300
800
mV
IIH
Input HIGH Current
OE
100
+100
mA
IIL
Input LOW Current
OE
100
+100
mA
VOH
Output HIGH Voltage
VDD1195
VDD945
mV
VOL
Output LOW Voltage
VDD1945
VDD1600
mV
VOUTPP
Output Voltage Amplitude
700
mV
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Symbol
Characteristic
Conditions
Min.
Typ.
Max.
Units
fCLKOUT
Output Clock Frequency
533.33
MHz
Df
Frequency Stability NBXSBA051
(Note 4)
卤50
ppm
FNOISE
PhaseNoise Performance
fCLKout = 533.33 MHz
(See Figure 3)
100 Hz of Carrier
90
dBc/Hz
1 kHz of Carrier
108
dBc/Hz
10 kHz of Carrier
115
dBc/Hz
100 kHz of Carrier
117
dBc/Hz
1 MHz of Carrier
123
dBc/Hz
10 MHz of Carrier
150
dBc/Hz
tjit(F)
RMS Phase Jitter
12 kHz to 20 MHz
0.5
0.7
ps
tjitter
Cycle to Cycle, RMS
1000 Cycles
1.5
8
ps
Cycle to Cycle, PeaktoPeak
1000 Cycles
10
30
ps
Period, RMS
10,000 Cycles
1
4
ps
Period, PeaktoPeak
10,000 Cycles
7
20
ps
tOE/OD
Output Enable/Disable Time
200
ns
tDUTY_CYCLE
Output Clock Duty Cycle
(Measured at Cross Point)
48
50
52
%
tR
Output Rise Time (20% and 80%)
250
400
ps
tF
Output Fall Time (80% and 20%)
250
400
ps
tstart
Startup Time
1
5
ms
Aging
1st Year
3
ppm
Every Year After 1st
1
ppm
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. Parameter guarantees 10 years of aging. Includes initial stability at 25掳C, shock, vibration, and first year aging.
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鐩搁棞浠ｇ悊鍟�/鎶€琛撳弮鏁�(sh霉) |
鍙冩暩(sh霉)鎻忚堪 |
|---|---|
| NBXSBA051LNHTAG | 鍔熻兘鎻忚堪:鏅傞悩鐧�(f膩)鐢熷櫒鍙婃敮鎸佺敘(ch菐n)鍝� XO LVPECL 533.3333 MHZ RoHS:鍚� 鍒堕€犲晢:Silicon Labs 椤炲瀷:Clock Generators 鏈€澶ц几鍏ラ牷鐜�:14.318 MHz 鏈€澶ц几鍑洪牷鐜�:166 MHz 杓稿嚭绔暩(sh霉)閲�:16 鍗犵┖姣� - 鏈€澶�:55 % 宸ヤ綔闆绘簮闆诲:3.3 V 宸ヤ綔闆绘簮闆绘祦:1 mA 鏈€澶у伐浣滄韩搴�:+ 85 C 瀹夎棰ㄦ牸:SMD/SMT 灏佽 / 绠遍珨:QFN-56 |
| NBXSBB020 | 鍒堕€犲晢:ONSEMI 鍒堕€犲晢鍏ㄧū:ON Semiconductor 鍔熻兘鎻忚堪:3.3 V, 280 MHz LVPECL Clock Oscillator |
| NBXSBB020LN1TAG | 鍒堕€犲晢:ONSEMI 鍒堕€犲晢鍏ㄧū:ON Semiconductor 鍔熻兘鎻忚堪:3.3 V, 280 MHz LVPECL Clock Oscillator |
| NBXSBB021 | 鍒堕€犲晢:ONSEMI 鍒堕€犲晢鍏ㄧū:ON Semiconductor 鍔熻兘鎻忚堪:Clock Oscillator |
| NBXSBB021LN1TAG | 鍒堕€犲晢:ONSEMI 鍒堕€犲晢鍏ㄧū:ON Semiconductor 鍔熻兘鎻忚堪:Clock Oscillator |
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