Figure 2. Pin Connections (Top View) FSEL OE GND CLK
參數(shù)資料
型號: NBXDDA016LN1TAG
廠商: ON Semiconductor
文件頁數(shù): 2/6頁
文件大?。?/td> 0K
描述: IC CLK XO 133.33/137.03MHZ 6CLCC
產(chǎn)品培訓模塊: XO Replacement Overview
標準包裝: 1
系列: PureEdge™
類型: 振蕩器 - 晶體
頻率: 133.33MHz,137.93MHz
電源電壓: 2.97 V ~ 3.63 V
電流 - 電源: 70mA
工作溫度: -40°C ~ 85°C
封裝/外殼: 6-CLCC
包裝: 標準包裝
供應(yīng)商設(shè)備封裝: 6-CLCC(7x5)
安裝類型: 表面貼裝
其它名稱: NBXDDA016LN1TAGOSDKR
NBXDDA016, NBXDDB016
http://onsemi.com
2
Figure 2. Pin Connections (Top View)
FSEL
OE
GND
CLK
VDD
CLK
1
2
3
6
5
4
Table 1. PIN DESCRIPTION
Pin No.
Symbol
I/O
Description
1
OE
LVTTL/LVCMOS
Control Input
Output Enable Pin. When left floating pin defaults to logic HIGH and output is active.
See OE pin description Table 2.
2
FSEL
Control Input
Output Frequency Select Pin. Pin will default LOW when left open. See Output Fre-
quency Select Table 3.
3
GND
Power Supply
Ground 0 V.
4
CLK
CML Output
NonInverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD.
5
CLK
CML Output
Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD.
6
VDD
Power Supply
Positive power supply voltage. Voltage should not exceed 3.3 V ±10%.
Table 2. OUTPUT ENABLE TRISTATE FUNCTION
OE Pin
Output Pins
Open
Active
High Level
Active
Low Level
High Z
Table 3. OUTPUT FREQUENCY SELECT
FSEL Pin
Output Frequency (MHz)
Open
(pin will float Low)
133.33
High Level
137.93
Low Level
133.33
Table 4. ATTRIBUTES
Characteristic
Value
Input Default State Resistor
170 kW
ESD Protection
Human Body Model
Machine Model
2 kV
200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
VDD
Positive Power Supply
GND = 0 V
4.6
V
TA
Operating Temperature Range
40 to +85
°C
Tstg
Storage Temperature Range
55 to +120
°C
Tsol
Wave Solder
See Figure 6
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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