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參數(shù)資料
| 型號： | NB3L553MNR4G |
| 廠商： | ON Semiconductor |
| 文件頁數(shù)： | 6/8頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC CLOCK BUFFER 1:4 200MHZ 8-DFN |
| 標準包裝： | 1 |
| 類型： | 扇出緩沖器（分配） |
| 電路數(shù)： | 1 |
| 比率 - 輸入:輸出： | 1:4 |
| 差分 - 輸入:輸出： | 無/無 |
| 輸入： | LVCMOS，LVTTL |
| 輸出： | LVCMOS，LVTTL |
| 頻率 - 最大： | 200MHz |
| 電源電壓： | 2.375 V ~ 5.25 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 8-VFDFN 裸露焊盤 |
| 供應商設(shè)備封裝： | 8-DFN（2x2） |
| 包裝： | 標準包裝 |
| 其它名稱： | NB3L553MNR4GOSDKR |
NB3L553
http://onsemi.com
6
Figure 2. Phase Noise Plot at 100 MHz at an Operating Voltage of 3.3 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 18 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 93.16 fs).
Figure 3. Phase Noise Plot at 100 MHz at an Operating Voltage of 5 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 29 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 103.85 fs).
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