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參數(shù)資料
| 型號： | MX7533J/D-T |
| 廠商： | MAXIM INTEGRATED PRODUCTS INC |
| 元件分類： | DAC |
| 英文描述： | PARALLEL, WORD INPUT LOADING, 10-BIT DAC, UUC16 |
| 封裝： | DIE-16 |
| 文件頁數(shù)： | 5/10頁 |
| 文件大小： | 194K |
| 代理商： | MX7533J/D-T |
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125
°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125
°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3
Group A Test Requirements
Method 5005
1, 2, 3, 4**
Group C and D End-Point Electrical Parameters
Method 5005
1
*
PDA applies to Subgroup 1 only.
**
Subgroup 4 shall be tested at initial qualification and upon redesign. Sample size will
be 116 units.
----------------------------
Electrical Characteristics of MX7533/883B
19-1026
Rev. B
Page 5 of
6
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