參數(shù)資料
型號： MSP430FW427IPMR
廠商： TEXAS INSTRUMENTS INC
元件分類： 微控制器/微處理器
英文描述： 16-BIT, FLASH, 8 MHz, RISC MICROCONTROLLER, PQFP64
封裝： GREEN, PLASTIC, QFP-64
文件頁數(shù)： 56/61頁
文件大小： 828K
代理商： MSP430FW427IPMR
MSP430FW42x
SLAS383D – OCTOBER 2003 – REVISED JANUARY 2011
www.ti.com
Table 2. Terminal Functions (continued)
TERMINAL
I/O
DESCRIPTION
NAME
NO.
COM0
36
O
Common output. COM0-3 are used for LCD backplanes
P5.2/COM1
37
I/O
General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes
P5.3/COM2
38
I/O
General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes
P5.4/COM3
39
I/O
General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes
R03
40
I
Input port of fourth positive (lowest) analog LCD level (V5)
P5.5/R13
41
I/O
General-purpose digital I/O/input port of third most positive analog LCD level (V4 or V3)
P5.6/R23
42
I/O
General-purpose digital I/O/input port of second most positive analog LCD level (V2)
P5.7/R33
43
I/O
General-purpose digital I/O/output port of most positive analog LCD level (V1)
P6.0/SIFCH0
59
I/O
General-purpose digital I/O/Scan IF, channel 0 sensor excitation output and signal input
P6.1/SIFCH1
60
I/O
General-purpose digital I/O/Scan IF, channel 1 sensor excitation output and signal input
P6.2/SIFCH2
61
I/O
General-purpose digital I/O/Scan IF, channel 2 sensor excitation output and signal input
P6.3/SIFCH3/
2
I/O
General-purpose digital I/O/Scan IF, channel 3 sensor excitation output and signal input/Scan
SIFCAOUT
IF comparator output
P6.4/SIFCI0
3
I/O
General-purpose digital I/O/Scan IF, channel 0 signal input to comparator
P6.5/SIFCI1
4
I/O
General-purpose digital I/O/Scan IF, channel 1 signal input to comparator
P6.6/SIFCI2/
5
I/O
General-purpose digital I/O/Scan IF, channel 2 signal input to comparator/10-bit DAC output
SIFDACOUT
P6.7/SIFCI3/SVSIN
6
I/O
General-purpose digital I/O/Scan IF, channel 3 signal input to comparator/SVS, analog input
SIFCI
7
I
Scan IF input to Comparator.
SIFCOM
11
O
Common termination for Scan IF sensors.
RST/NMI
58
I
Reset input or nonmaskable interrupt input port.
TCK
57
I
Test clock. TCK is the clock input port for device programming and test.
TDI/TCLK
55
I
Test data input or test clock input. The device protection fuse is connected to TDI/TCLK.
TDO/TDI
54
I/O
Test data output port. TDO/TDI data output or programming data input terminal.
TMS
56
I
Test mode select. TMS is used as an input port for device programming and test.
XIN
8
I
Input port for crystal oscillator XT1. Standard or watch crystals can be connected.
XOUT
9
O
Output terminal of crystal oscillator XT1.
6
Copyright 2003–2011, Texas Instruments Incorporated
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