MPC755 RISC Microprocessor Hardware Specifications, Rev. 8
Freescale Semiconductor
9
Electrical and Thermal Characteristics
The MPC755 incorporates a thermal management assist unit (TAU) composed of a thermal sensor,
digital-to-analog converter, comparator, control logic, and dedicated special-purpose registers (SPRs). See
the MPC750 RISC Microprocessor Family User’s Manual for more information on the use of this feature.
Specifications for the thermal sensor portion of the TAU are found in
Table 5.
Table 4. Package Thermal Characteristics 6
Characteristic
Symbol
Value
Unit
Notes
MPC755
CBGA
MPC755
PBGA
MPC745
PBGA
Junction-to-ambient thermal resistance, natural
convection
RθJA
24
31
34
°C/W
1, 2
Junction-to-ambient thermal resistance, natural
convection, four-layer (2s2p) board
RθJMA
17
25
26
°C/W
1, 3
Junction-to-ambient thermal resistance, 200 ft/min
airflow, single-layer (1s) board
RθJMA
18
25
27
°C/W
1, 3
Junction-to-ambient thermal resistance, 200 ft/min
airflow, four-layer (2s2p) board
RθJMA
14
21
22
°C/W
1, 3
Junction-to-board thermal resistance
RθJB
817
17
°C/W
4
Junction-to-case thermal resistance
RθJC
<0.1
°C/W
5
Notes:
1. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal.
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1) with the calculated case temperature. The actual value of RθJC for the part is less than 0.1°C/W.