參數(shù)資料
型號(hào)： MN54ABT244
廠商： National Semiconductor Corporation
英文描述： MN54ABT244-X REV 0B0
中文描述： MN54ABT244 - X活0B0
文件頁數(shù)： 6/13頁
文件大?。?/td> 206K
代理商： MN54ABT244
MN54ABT244-X REV 0B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpLH
Propagation Delay
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 In to
On
1.0
4.1
ns
9
2, 5 In to
On
1.0
5.3
ns
10, 11
tpHL
Propagation Delay
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 In to
On
1.0
4.2
ns
9
2, 5 In to
On
1.0
5.0
ns
10, 11
tpZL
Output Enable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to
On
2.1
5.6
ns
9
2, 5 OE to
On
1.2
7.9
ns
10, 11
tpZH
Output Enable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to
On
1.1
5.5
ns
9
2, 5 OE to
On
0.8
6.5
ns
10, 11
tpHZ
Output Disable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to
On
2.1
5.6
ns
9
2, 5 OE to
On
1.2
7.6
ns
10, 11
tpLZ
Output Disable
Time
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
2, 5 OE to
On
1.5
5.6
ns
9
2, 5 OE to
On
1.0
7.9
ns
10, 11
Note 1:
SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8.
Note 2:
SCREEN TESTED 100% ON EACH DEVICE AT -55C, +25C & +125C TEMP., SUBGROUPS A9, A10 &
A11.
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMP. ONLY, SUBGROUP 9.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,
SUBGROUPS A1, 2, 3, 7 & 8.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,
SUBGROUPS A9, 10, & 11.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C TEMP ONLY, SUBGROUP A9.
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA).
MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE
OUTPUT @ VOL OR @ VOH.
MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V.
INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), 0V TO THRESHOLD (VIHD), FREQ.= 1
MHZ.
Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT
ONE TIME.
Note 9:
6
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