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參數(shù)資料
| 型號： | MM54C923J-MIL |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 算術邏輯單元 |
| 英文描述： | CMOS SERIES, 9-BIT ENCODER, TRUE OUTPUT, CDIP20 |
| 文件頁數(shù)： | 1/7頁 |
| 文件大?。?/td> | 16K |
| 代理商： | MM54C923J-MIL |
Original Creation Date: 10/26/95
Last Update Date: 05/19/97
Last Major Revision Date: 04/02/97
MNMM54C923-X REV 1A0
MICROCIRCUIT DATA SHEET
20-KEY ENCODER
General Description
These CMOS key encoders provide all the necessary logic to fully encode an array of SPST
switches. The keyboard scan can be implemented by either an external clock or external
capacitor. These encoders also have on-chip pull-up devices which permit switches with up
to 50K Ohms on resistance to be used. No diodes in the switch array are needed to
eliminate ghost switches. The internal debounce circuit needs only a single external
capacitor and can be defeated by omitting the capacitor. A Data Available output goes to a
high level when a valid keyboard entry has been made. The Data Available output returns to
a low level when the entered key is released, even if another key is depressed. The Data
Available will return high to indicate acceptance of the new key after a normal debounce
period; this two-key roll-over is provided between any two switches.
An internal register remembers the last key pressed even after the key is release. The
TRI-STATE outputs provide for easy expansion and bus operation and are LPTTL compatible.
NS Part Numbers
MM54C923J-MIL
Industry Part Number
MM54C923
Prime Die
MM54C923
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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