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參數(shù)資料
| 型號(hào)： | MM54C85W/883 |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 算術(shù)邏輯單元 |
| 英文描述： | CMOS SERIES, 4-BIT MAGNITUDE COMPARATOR, TRUE OUTPUT, CDFP16 |
| 文件頁(yè)數(shù)： | 1/5頁(yè) |
| 文件大?。?/td> | 13K |
| 代理商： | MM54C85W/883 |
Original Creation Date: 10/25/95
Last Update Date: 05/19/97
Last Major Revision Date: 04/02/97
MNMM54C85-X REV 1A0
MICROCIRCUIT DATA SHEET
4-BIT MAGNITUDE COMPARATOR
General Description
The MM54C85 is a four-bit magnitude comparator which will perform comparison of straight
binary or BCD codes. The circuit consists of eight comparing inputs (A0, A1, A2, A3, B0,
B1, B2, B3), three cascading inputs (A > B, A < B and A = B), and three outputs (A > B, A
< B and A = B). This device compares two four-bit words (A and B) and determines whether
they are "greater than", "less than", or "equal to" each other by a high level on the
appropriate output. For words greater than four-bits, units can be cascaded by connecting
the outputs (A > B, A < B and A = B) of the lease significant stage to the cascade inputs
(A > B, A < B and A = B) of the next-significant stage. In addition the lease significant
stage must have a high level voltage (Vin(1)) applied to the A = B input and low level
voltage (Vin(0)) applies to A > B and A < B inputs.
NS Part Numbers
MM54C85J/883
MM54C85W/883
Industry Part Number
MM54C85
Prime Die
MM54C85
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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相關(guān)代理商/技術(shù)參數(shù) |
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| MM54C86 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Quad 2-Input EXCLUSIVE-OR Gate |
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