參數(shù)資料
型號(hào): MLX10803KDC
廠商: Electronic Theatre Controls, Inc.
英文描述: High power LED driver
中文描述: 高功率LED驅(qū)動(dòng)器
文件頁數(shù): 12/25頁
文件大?。?/td> 479K
代理商: MLX10803KDC
IC specification
MLX10803
High power LED driver
3901010803 Page 12/25
Data Sheet
Rev 025 2/OCT/07
6.
Automotive test pulses
The following chapter is valid for a completely assembled module. That means that automotive test pulses are
applied to the module and not to the single IC.
In the recommended application according to chapter 1.1, the reverse polarity diode together with the capacitors
on the supply and the load dump protected IC itself protect the module against the automotive test pulses listed
below.
The exact values of the capacitors for the application have to be figured out according to the automotive and
EMI requirements.
No damage occurs for any of the test pulses. A deviation of the IC’s characteristics is allowed during pulse 1, 2, 4;
the module returns to normal operation after the pulse without any additional action.
During test pulse 3a, 3b, 5 the module operates within characteristic limits.
Parameter
Symbol
Min
Max
Dim
Test condition,
Functional status
Transient test pulses in accordance to ISO7637 part 1 & 3. Pin VREF goes outside of module via
resistor of 47k
. Module schematic is according to application notes mentioned in 1.1.1.
Test pulse #1 at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
Test pulse #2 at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
Test pulse #3a at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
Test pulse #3b at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
Test pulse #4 at module pin VBAT,
VS/PWM, VREF_SET -> GND
vapulse4
Test pulse #5 at IC pin VS/PWM -> GND
vpulse5
vpulse1
-100
V
5000 pulses,
functional state C
vpulse2
100
V
5000 pulses
functional state C
vpulse3a
-150
V
1h,
functional state A
vpulse3b
100
V
1h,
functional state A
vspulse4
-6
-5
45
-4
-2.5
85
V
V
V
1 pulse,
functional state C
functional state C
Description of functional status:
A:
All functions of the module are performed as designed during and after the disturbance.
B:
All functions of the module are performed as designed during and after the disturbance:
However, one or more can deviate from specified tolerance. All functions return automatically
to normal limits after exposure is removed. Memory functions shall remain class A.
C:
A function of the module is not performed as designed during disturbance but returns automatically to
a normal operation after the disturbance.
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