參數(shù)資料
型號(hào): MJE5852AN
廠商: ON SEMICONDUCTOR
元件分類: 功率晶體管
英文描述: 8 A, 400 V, PNP, Si, POWER TRANSISTOR
封裝: PLASTIC, TO-220AB, 3 PIN
文件頁(yè)數(shù): 34/63頁(yè)
文件大?。?/td> 445K
代理商: MJE5852AN
MJE5850 MJE5851 MJE5852
3–647
Motorola Bipolar Power Transistor Device Data
1
INPUT
Rcoil
Lcoil
VCC
Vclamp
RS =
0.1
1N4937
OR
EQUIVALENT
TUT
SEE ABOVE FOR
DETAILED CONDITIONS
20
1
0
PW Varied to Attain
IC = 100 mA
2
–10 V
t1
ICM
tf Clamped
tf
t
Vclamp
t2
TIME
VCEM
1
2
TUT
RL
VCC
t1 Adjusted to
Obtain IC
Test Equipment
Scope — Tektronix
475 or Equivalent
t1 ≈
Lcoil (ICM)
VCC
t2 ≈
Lcoil (ICM)
VClamp
VCEO(sus)
RBSOA AND INDUCTIVE SWITCHING
RESISTIVE SWITCHING
INPUT
CONDITIONS
CIRCUIT
V
ALUES
TEST
CIRCUITS
– V adjusted to obtain desired IB1
+ V adjusted to obtain desired VBE(off)
+ V
50
2 W
INPUT
0
0.2
F
0.0025
F
0.1
F
500
1/2 W
500
0.0033
F
500
1/2 W
+ V
50
F
0.1
F
MJE15029
1
2
1
2 W
MJE15028
50
F
– V
+–
1/2 W
1N4934
0.1
F
–+
500
1/2 W
0.2
F
IB1 adjusted to
obtain the forced
hFE desired
TURN–OFF TIME
Use inductive switching
driver as the input to
the resistive test circuit.
IB1
1
2
TURN–ON TIME
Lcoil = 80 mH, VCC = 10 V
Rcoil = 0.7
Lcoil = 180 H
Rcoil = 0.05
VCC = 20 V
VCC = 250 V
RL = 62
Pulse Width = 10
s
INDUCTIVE TEST CIRCUIT
RESISTIVE TEST CIRCUIT
OUTPUT WAVEFORMS
Vclamp = 250 V
RB adjusted to attain desired IB1
VCE
IC
Table 1. Test Conditions for Dynamic Performance
,CROSSOVER
TIME
(
t c
s)
tti
Figure 7. Inductive Switching Measurements
TIME
IB
VCE
90% IB1
tsr
tc
10%
VCEM
Figure 8. Inductive Switching Times
IC = 4 A
IC/IB = 4
TJ = 25°C
tc 100°C
tsv 100°C
tsv 25°C
tc 25°C
VBE, BASE–EMITTER VOLTAGE (VOLTS)
0
0.4
0.2
1.0
0.6
0.8
36
8
05
7
2
14
tsv
,VOL
TAGE
ST
ORAGE
TIME
(
s)
0
0.9
0.3
2.7
1.5
2.1
1.2
0.6
3.0
1.8
2.4
IC
10%
ICM
2%
ICM
trv
tfi
90%
ICM
VCEM
Vclamp
相關(guān)PDF資料
PDF描述
MJE5852AK 8 A, 400 V, PNP, Si, POWER TRANSISTOR
MJE5852AJ 8 A, 400 V, PNP, Si, POWER TRANSISTOR
MJE5851AS 8 A, 350 V, PNP, Si, POWER TRANSISTOR
MJE5851AN 8 A, 350 V, PNP, Si, POWER TRANSISTOR
MJE5850BD 8 A, 300 V, PNP, Si, POWER TRANSISTOR
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