參數(shù)資料
型號: MJE5742BA
廠商: ON SEMICONDUCTOR
元件分類: 功率晶體管
英文描述: 8 A, 400 V, NPN, Si, POWER TRANSISTOR
封裝: PLASTIC, TO-220AB, 3 PIN
文件頁數(shù): 23/61頁
文件大?。?/td> 397K
代理商: MJE5742BA
MJE5740 MJE5741 MJE5742
3–642
Motorola Bipolar Power Transistor Device Data
REVERSE BIAS SAFE OPERATING AREA AND INDUCTIVE SWITCHING
RESISTIVE
SWITCHING
OUTPUT WAVEFORMS
TEST
CIRCUITS
CIRCUIT
V
ALUES
TEST
W
A
VEFORMS
NOTE:
PW and VCC Adjusted for Desired IC
RB Adjusted for Desired IB1
PW
DUTY CYCLE
≤ 10%
tr, tf ≤ 10 ns
68
1 k
0.001
F
0.02
F
1N4933
270
+5 V
1 k
2N2905
47
1/2 W
100
–VBE(off)
MJE200
T.U.T.
IB
RB
1N4933
33
2N2222
1 k
MJE210
VCC
+5 V
L
IC
MR826*
Vclamp
*SELECTED FOR
≥ 1 kV
VCE
5.1 k
51
+VCC
RC
SCOPE
–4 V
D1
RB
TUT
COIL DATA:
FERROXCUBE CORE #6656
FULL BOBBIN (~16 TURNS) #16
GAP FOR 200
H/20 A
Lcoil = 200 H
VCC = 30 V
VCE(pk) = 250 Vdc
IC(pk) = 6 A
VCC = 250 V
D1 = 1N5820 OR EQUIV.
IC
VCE
IC(pk)
t1
tf
t
t2
TIME
VCE OR
Vclamp
tf CLAMPED
t1 ADJUSTED TO
OBTAIN IC
t1 ≈
Lcoil (ICpk)
VCC
t2 ≈
Lcoil (ICpk)
Vclamp
TEST EQUIPMENT
SCOPE–TEKTRONICS
475 OR EQUIVALENT
+10 V
25
s
0
– 9.2 V
tr, tf < 10 ns
DUTY CYCLE = 1%
RB AND RC ADJUSTED
FOR DESIRED IB AND IC
Table 1. Test Conditions for Dynamic Performance
V
CE
,C
OLLE
CT
OR–EMI
TT
ER
V
OL
TAGE
(
V
OL
T
S
Figure 5. Inductive Switching Measurements
IC, COLLECTOR CURRENT (AMPS)
1
0.2
0.1
1.4
0.8
1.2
10
5
2
1
0.5
0.2
1.6
1.8
0.6
0.4
hFE = 20
+25
°C
–55
°C
+150
°C
相關(guān)PDF資料
PDF描述
MJE5742AN 8 A, 400 V, NPN, Si, POWER TRANSISTOR
MJE5741BC 8 A, 350 V, NPN, Si, POWER TRANSISTOR
MJE5741AU 8 A, 350 V, NPN, Si, POWER TRANSISTOR
MJE5741AN 8 A, 350 V, NPN, Si, POWER TRANSISTOR
MJE5740BV 8 A, 300 V, NPN, Si, POWER TRANSISTOR
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