參數(shù)資料
型號: MCM69C433
廠商: Motorola, Inc.
英文描述: A Flexible Content-Addressable Memory (16K x 64 CAM)(1M內(nèi)容可定址存儲器)
中文描述: 一個靈活的內(nèi)容尋址存儲器(16K的× 64 CAM)的(100萬內(nèi)容可定址存儲器)
文件頁數(shù): 16/22頁
文件大小: 167K
代理商: MCM69C433
MCM69C433
SCM69C433
16
MOTOROLA FAST SRAM
JTAG
AC OPERATING CONDITIONS AND CHARACTERISTICS
FOR THE TEST ACCESS PORT (IEEE 1149.1)
(TJ < 120
°
C, Unless Otherwise Noted)
Input Timing Measurement Reference Level
Input Pulse Levels
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . .
0 to 3.0 V
3 ns
Output Measurement Timing Level
Output Load
. . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . . . . . . . . . .
50
Termination to 1.5 V
TAP CONTROLLER TIMING
Parameter
Symbol
Min
Max
Unit
Notes
Cycle Time
tCK
tCKH
tCKL
tA
tCKZ
tCKX
tS
tSD
tSR
30
ns
Clock High Time
12
ns
Clock Low Time
12
ns
Clock Low to Output Valid
5
9
ns
Clock Low to Output High–Z
0
9
ns
1
Clock Low to Output Active
0
9
ns
2, 3
Setup Times:
TMS
TDI
TRST
2
2
2
ns
Hold Times:
TMS
TDI
TRST
tH
tHD
tHR
2
2
10
ns
NOTES:
1. TDO will High–Z from a clock low edge depending on the current state of the TAP state machine.
2. TDO is active only in the SHIFT–IR and SHIFT–DR state of the TAP state machine.
3. Transition is measured
±
500 mV from steady–state voltage. This parameter is sampled and not 100% tested.
TDI TEST
DATA IN
TCK TEST
CLOCK
tCK
TDO TEST
DATA OUT
tH
tCKX
tSD
tS
tHD
tA
tCKZ
TMS TEST
MODE SELECT
tCKH
tCKL
Figure 4. TAP Controller Timing
tSR
tHR
TRST
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