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參數(shù)資料
| 型號： | MCM6946 |
| 廠商： | Motorola, Inc. |
| 英文描述： | 512Kx8 Bit Static Random Access Memory(512Kx8位靜態(tài)RAM) |
| 中文描述： | 512Kx8位靜態(tài)隨機存取存儲器（512Kx8位靜態(tài)RAM）的 |
| 文件頁數(shù)： | 4/9頁 |
| 文件大?。?/td> | 171K |
| 代理商： | MCM6946 |
SCM6946
MCM6946
4
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V – 5%, + 10%, TA = 0 to 70
°
C, Unless Otherwise Noted)
Input Pulse Levels
Input Rise/Fall Time
Input Timing Measurement Reference Level
0 to 3.0 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2 ns
1.5 V
. . . . . . . . . . . . . . .
Output Timing Measurement Reference Level
Output Load
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . .
See Figure 1
READ CYCLE TIMING
(See Notes 1 and 2)
Parameter
Symbol
b l
SCM6946–8
MCM6946–10
MCM6946–12
MCM6946–15
U i
Unit
Notes
Min
Max
Min
Max
Min
Max
Min
Max
Read Cycle Time
tAVAV
tAVQV
tELQV
tGLQV
tAXQX
tELQX
tGLQX
tEHQZ
tGHQZ
8
—
10
—
12
—
15
—
ns
3
Address Access Time
—
8
—
10
—
12
—
15
ns
Enable Access Time
—
8
—
10
—
12
—
15
ns
4
Output Enable Access Time
—
4
—
5
—
6
—
7
ns
Output Hold from Address Change
2
—
2
—
2
—
2
—
ns
Enable Low to Output Active
3
—
3
—
3
—
3
—
ns
5, 6, 7
Output Enable Low to Output Active
0
—
0
—
0
—
0
—
ns
5, 6, 7
Enable High to Output High–Z
0
4
0
5
0
6
0
7
ns
5, 6, 7
Output Enable High to Output High–Z
0
4
0
5
0
6
0
7
ns
5, 6, 7
NOTES:
1. W is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All read cycle timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E going low.
5. At any given voltage and temperature, tEHQZ max
tELQX min, and tGHQZ max
to device.
6. Transition is measured
±
200 mV from steady–state voltage.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E
≤
VIL, G
≤
VIL).
tGLQX min, both for a given device and from device
The table of timing values shows either a minimum
or a maximum limit for each parameter. Input require-
ments are specified from the external system point of
view. Thus, address setup time is shown as a mini-
mum since the system must supply at least that much
time. On the other hand, responses from the memory
are specified from the device point of view. Thus, the
access time is shown as a maximum since the device
never provides data later than that time.
TIMING LIMITS
OUTPUT
Z0 = 50
RL = 50
VL = 1.5 V
Figure 1. AC Test Load
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