參數(shù)資料
型號: MCF51QE128CLK
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP80
封裝: 14 X 14 MM, ROHS COMPLIANT, LQFP-80
文件頁數(shù): 38/38頁
文件大?。?/td> 978K
代理商: MCF51QE128CLK
Electrical Characteristics
MCF51QE128 Series Data Sheet, Rev. 7
Freescale Semiconductor
9
3
Electrical Characteristics
3.1
Introduction
This section contains electrical and timing specifications for the MCF51QE128 series of microcontrollers available at the time
of publication.
3.2
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
3.3
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 4 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised
that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either VSS or VDD) or the programmable pull-up resistor associated with the pin is enabled.
1 SPI1 pins (SS1, MISO1, MOSI1, and SPSCK2) can be repositioned using SPI1PS
in SOPT2. Default locations are PTB5, PTB4, PTB3, and PTB2.
2 IIC1 pins (SCL1 and SDA1) can be repositioned using IIC1PS in SOPT2. Default
locations are PTA3 and PTA2, respectively.
3 The PTA4/ACMP1O/BKGD/MS is limited to output only for the port I/O function.
Table 3. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant sample
size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D
Those parameters are derived mainly from simulations.
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