
Appendix A Electrical Characteristics and Timing Specications
MC9S08AW60 Data Sheet, Rev 2
298
Freescale Semiconductor
19
MC9S08AWxx: Internal oscillator deviation from trimmed frequency9
C
VDD = 2.7 – 5.5 V, (constant temperature)
ACCint
—
±0.5
±2%
PVDD = 5.0 V ±10%, –40° C to 125°C—
±0.5
±2%
S9S08AWxx: Internal oscillator deviation from trimmed frequency
9 C
VDD = 2.7 – 5.5 V, (constant temperature)
ACCint
—
±0.5
±1.5
%
PVDD = 5.0 V ±10%, –40° C to 85°C—
±0.5
±1.5
%
PVDD = 5.0 V ±10%, –40° C to 125°C—
±0.5
±2%
1 Typical values are based on characterization data at V
DD = 5.0V, 25°C unless otherwise stated.
2 Self-clocked mode frequency is the frequency that the DCO generates when the FLL is open-loop.
3 Loss of reference frequency is the reference frequency detected internally, which transitions the ICG into self-clocked mode if it
is not in the desired range.
4 Loss of DCO frequency is the DCO frequency detected internally, which transitions the ICG into FLL bypassed external mode
(if an external reference exists) if it is not in the desired range.
5 This parameter is characterized before qualication rather than 100% tested.
6 Proper PC board layout procedures must be followed to achieve specications.
7 This specication applies to the period of time required for the FLL to lock after entering FLL engaged internal or external modes.
If a crystal/resonator is being used as the reference, this specication assumes it is already running.
8 Jitter is the average deviation from the programmed frequency measured over the specied interval at maximum f
ICGOUT.
Measurements are made with the device powered by ltered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via VDDA and VSSA and variation in crystal oscillator frequency increase the CJitter percentage for
a given interval.
Table A-12. ICG Frequency Specications (continued)
(VDDA = VDDA (min) to VDDA (max), Temperature Range = –40 to 125°C Ambient)
Num
C
Characteristic
Symbol
Min
Typ1
Max
Unit