
Appendix A Electrical Characteristics and Timing Specifications
MC9S08AC16 Series Data Sheet, Rev. 9
Freescale Semiconductor
317
Program and erase operations do not require any special power sources other than the normal VDD supply.
A.13
EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
Table A-15. FLASH Characteristics
Num
C
Characteristic
Symbol
Min
Typ1
1 Typical values are based on characterization data at V
DD = 5.0 V, 25C unless otherwise stated.
Max
Unit
1
Supply voltage for program/erase
Vprog/erase
2.7
5.5
V
2
Supply voltage for read operation
VRead
2.7
5.5
V
Internal FCLK frequency2
2 The frequency of this clock is controlled by a software setting.
fFCLK
150
200
kHz
4
Internal FCLK period (1/FCLK)
tFcyc
56.67
s
5
Byte program time (random location)(2)
tprog
9
tFcyc
6
Byte program time (burst mode)(2)
tBurst
4
tFcyc
7
Page erase time3
3 These values are hardware state machine controlled. User code does not need to count cycles. This information
supplied for calculating approximate time to program and erase.
tPage
4000
tFcyc
8
Mass erase time(2)
tMass
20,000
tFcyc
9C
Program/erase endurance4
TL to TH = –40C to + 125C
T = 25
C
4 Typical endurance for FLASH was evaluated for this product family on the 9S12Dx64. For additional information
on how Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619, Typical
Endurance for Nonvolatile Memory.
10,000
—
100,000
—
cycles
10
Data retention5
5 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25
C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines
typical data retention, please refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
tD_ret
15
100
—
years