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參數(shù)資料
| 型號(hào)： | MC74VHC1G32 |
| 廠商： | ON SEMICONDUCTOR |
| 英文描述： | Single 2-Input OR Gate(或門) |
| 中文描述： | 單2輸入或門（或門） |
| 文件頁(yè)數(shù)： | 2/6頁(yè) |
| 文件大?。?/td> | 144K |
| 代理商： | MC74VHC1G32 |
MC74VHC1G32
http://onsemi.com
2
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage
0.5 to
7.0
V
V
IN
DC Input Voltage
0.5 to +7.0
V
V
OUT
DC Output Voltage
0.5 to V
CC
0.5
V
I
IK
DC Input Diode Current
20
mA
I
OK
DC Output Diode Current
20
mA
I
OUT
DC Output Sink Current
12.5
mA
I
CC
DC Supply Current per Supply Pin
25
mA
T
STG
Storage Temperature Range
65 to
150
°
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
260
°
C
T
J
Junction Temperature Under Bias
150
°
C
JA
Thermal Resistance
SC70
5/SC
88A (Note 1)
TSOP
5
350
230
°
C/W
P
D
Power Dissipation in Still Air at 85
°
C
SC70
5/SC
88A
TSOP
5
150
200
mW
MSL
Moisture Sensitivity
Level 1
F
R
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V
0 @ 0.125 in
V
ESD
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
2000
200
N/A
V
I
LATCHUP
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm
by
1 inch, 2
ounce copper trace with no air flow.
2. Tested to EIA/JESD22
A114
A.
3. Tested to EIA/JESD22
A115
A.
4. Tested to JESD22
C101
A.
5. Tested to EIA/JESD78.
Latchup Performance
Above V
CC
and Below GND at 125
°
C (Note 5)
500
mA
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
V
CC
V
IN
V
OUT
T
A
t
r
, t
f
DC Supply Voltage
2.0
5.5
V
DC Input Voltage
0.0
5.5
V
DC Output Voltage
0.0
V
CC
+125
V
Operating Temperature Range
55
°
C
Input Rise and Fall Time
V
CC
= 3.3 V
±
0.3 V
V
CC
= 5.0 V
±
0.5 V
N
0
0
100
20
ns/V
Device Junction Temperature versus
Time to 0.1% Bond Failures
Junction
Temperature
°
C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
1
1
10
100
1000
TIME, YEARS
T
°
T
°
T
°
T
°
T
°
T
°
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Figure 3. Failure Rate vs. Time
Junction Temperature
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| MC74VHC1G32DFT | 制造商:ON Semiconductor 功能描述: |
| MC74VHC1G32DFT1 | 功能描述:邏輯門 2-5.5V Single OR RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時(shí)間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| MC74VHC1G32DFT1G | 功能描述:邏輯門 2-5.5V Single OR 2-Input RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時(shí)間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| MC74VHC1G32DFT2 | 功能描述:邏輯門 2-5.5V Single OR RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時(shí)間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| MC74VHC1G32DFT2G | 功能描述:邏輯門 2-5.5V Single OR 2-Input RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時(shí)間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
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