參數(shù)資料
型號: MC74ACT151
廠商: ON SEMICONDUCTOR
英文描述: 1−of−8 Decoder/Demultiplexer
文件頁數(shù): 5/10頁
文件大?。?/td> 247K
代理商: MC74ACT151
MC74AC151, MC74ACT151
http://onsemi.com
5
AC CHARACTERISTICS
(For Figures and Waveforms
See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
Symbol
Parameter
V
CC
*
(V)
74AC
74AC
Unit
Fig.
No.
T
A
= +25
°
C
C
L
= 50 pF
T
A
=
40
°
C
to +85
°
C
C
L
= 50 pF
Min
Typ
Max
Min
Max
t
PLH
Propagation Delay
S
n
to Z or Z
3.3
5.0
3.0
2.5
11.5
8.5
18.0
13.0
3.0
2.0
20.0
15.0
ns
3
6
t
PHL
Propagation Delay
S
n
to Z or Z
3.3
5.0
2.5
2.0
12
8.5
18.0
13.0
2.5
1.5
20.0
15.0
ns
3
6
t
PLH
Propagation Delay
E
to Z or Z
3.3
5.0
2.5
2.0
8.0
6.0
13.0
10.0
2.0
1.5
14.0
11.0
ns
3
6
t
PHL
Propagation Delay
E
to Z or Z
3.3
5.0
1.5
1.5
8.5
6.5
13.0
10.0
1.5
1.5
14.0
11.0
ns
3
6
t
PLH
Propagation Delay
I
n
to Z or Z
3.3
5.0
2.5
1.5
9.5
7.0
14.0
10.5
2.0
1.5
15.5
11.0
ns
3
5
t
PHL
Propagation Delay
I
n
to Z or Z
3.3
5.0
2.5
1.5
9.5
7.0
15.0
11.0
2.0
1.5
16.0
12.0
ns
3
5
*Voltage Range 3.3 V is 3.3 V
±
0.3 V
*Voltage Range 5.0 V is 5.0 V
±
0.5 V
DC CHARACTERISTICS
Symbol
Parameter
V
CC
(V)
74ACT
74ACT
Unit
Conditions
T
A
= +25
°
C
T
A
=
40
°
C to
+85
°
C
Typ
Guaranteed Limits
V
IH
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
V
V
OUT
= 0.1 V
or V
CC
0.1 V
V
IL
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
V
V
OUT
= 0.1 V
or V
CC
0.1 V
V
OH
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
V
I
OUT
=
50
μ
A
V
*V
IN
= V
IL
or V
IH
I
OH
4.5
5.5
3.86
4.86
3.76
4.76
24 mA
24 mA
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
V
I
OUT
= 50
μ
A
V
*V
IN
= V
IL
or V
IH
I
OL
4.5
5.5
0.36
0.36
0.44
0.44
24 mA
24 mA
I
IN
Maximum Input
Leakage Current
5.5
±
0.1
±
1.0
μ
A
V
I
= V
CC
, GND
I
CCT
I
OLD
Additional Max. I
CC
/Input
Minimum Dynamic
Output Current
5.5
0.6
1.5
mA
V
I
= V
CC
2.1 V
V
OLD
= 1.65 V Max
5.5
75
mA
I
OHD
5.5
75
mA
V
OHD
= 3.85 V Min
I
CC
Maximum Quiescent
Supply Current
5.5
8.0
80
μ
A
V
IN
= V
CC
or GND
*All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
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