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參數(shù)資料
| 型號： | MC74AC109D |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 鎖存器 |
| 英文描述： | AC SERIES, DUAL POSITIVE EDGE TRIGGERED J-KBAR FLIP-FLOP, COMPLEMENTARY OUTPUT, PDSO16 |
| 封裝： | SOIC-16 |
| 文件頁數(shù)： | 3/9頁 |
| 文件大?。?/td> | 233K |
| 代理商： | MC74AC109D |
MC74AC109, MC74ACT109
http://onsemi.com
3
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
′AC
2.0
5.0
6.0
V
′ACT
4.5
5.0
5.5
VIN, VOUT
DC Input Voltage, Output Voltage (Ref. to GND)
0
VCC
V
tr, tf
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
VCC @ 3.0 V
150
VCC @ 4.5 V
40
ns/V
VCC @ 5.5 V
25
tr, tf
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
VCC @ 4.5 V
10
ns/V
VCC @ 5.5 V
8.0
TJ
Junction Temperature (PDIP)
140
°C
TA
Operating Ambient Temperature Range
40
25
85
°C
IOH
Output Current High
24
mA
IOL
Output Current Low
24
mA
1. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
Symbol
Parameter
VCC
(V)
74AC
Unit
Conditions
TA = +25°C
TA =
40°C to
+85°C
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
1.5
2.1
VOUT = 0.1 V
4.5
2.25
3.15
V
or VCC 0.1 V
5.5
2.75
3.85
VIL
Maximum Low Level
Input Voltage
3.0
1.5
0.9
VOUT = 0.1 V
4.5
2.25
1.35
V
or VCC 0.1 V
5.5
2.75
1.65
VOH
Minimum High Level
Output Voltage
3.0
2.99
2.9
IOUT = 50 μA
4.5
4.49
4.4
V
5.5
5.49
5.4
V
*VIN = VIL or VIH
3.0
2.56
2.46
12 mA
4.5
3.86
3.76
IOH
24 mA
5.5
4.86
4.76
24 mA
VOL
Maximum Low Level
Output Voltage
3.0
0.002
0.1
IOUT = 50 μA
4.5
0.001
0.1
V
5.5
0.001
0.1
V
*VIN = VIL or VIH
3.0
0.36
0.44
12 mA
4.5
0.36
0.44
IOL
24 mA
5.5
0.36
0.44
24 mA
IIN
Maximum Input
Leakage Current
5.5
±0.1
±1.0
μA
VI = VCC, GND
IOLD
Minimum Dynamic
Output Current
5.5
75
mA
VOLD = 1.65 V Max
IOHD
5.5
75
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
4.0
40
μA
VIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
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