參數(shù)資料
型號(hào): MC14528B
廠商: ON SEMICONDUCTOR
英文描述: Dual Monostable Multivibrator(雙單穩(wěn)態(tài)多振蕩器)
中文描述: 雙單穩(wěn)態(tài)觸發(fā)器(雙單穩(wěn)態(tài)多振蕩器)
文件頁(yè)數(shù): 4/12頁(yè)
文件大?。?/td> 112K
代理商: MC14528B
MC14528B
http://onsemi.com
4
SWITCHING CHARACTERISTICS
(8.)
(C
L
= 50 pF, T
A
= 25 C)
Characteristic
Symbol
C
X
pF
R
X
k
V
DD
Vdc
Min
Typ
(9.)
Max
Unit
Output Rise and Fall Time
t
TLH
, t
THL
= (1.5 ns/pF) C
L
+ 25 ns
t
TLH
, t
THL
= (0.75 ns/pF) C
L
+ 12.5 ns
t
TLH
, t
THL
= (0.55 ns/pF) C
L
+ 9.5 ns
Turn–Off, Turn–On Delay Time — A or B to Q or Q
t
PLH
, t
PHL
= (1.7 ns/pF) C
L
+ 240 ns
t
PLH
, t
PHL
= (0.66 ns/pF) C
L
+ 87 ns
t
PLH
, t
PHL
= (0.5 ns/pF) C
L
+ 65 ns
Turn–Off, Turn–On Delay Time — A or B to Q or Q
t
PLH
, t
PHL
= (1.7 ns/pF) C
L
+ 620 ns
t
PLH
, t
PHL
= (0.66 ns/pF) C
L
+ 257 ns
t
PLH
, t
PHL
= (0.5 ns/pF) C
L
+ 185 ns
Input Pulse Width — A or B
t
TLH
,
t
THL
5.0
10
15
100
50
40
200
100
80
ns
t
PLH
,
t
PHL
15
5.0
5.0
10
15
325
120
90
650
240
180
ns
t
PLH
,
t
PHL
1000
10
5.0
10
15
705
290
210
ns
t
WH
15
5.0
5.0
10
15
150
75
55
70
30
30
ns
t
WL
1000
10
5.0
10
15
70
30
30
ns
Output Pulse Width — Q or Q
(For C
X
< 0.01
μ
F use graph for
appropriate V
DD
level.)
Output Pulse Width — Q or Q
(For C
X
> 0.01
μ
F use formula:
t
W
= 0.2 R
X
C
X
Ln [V
DD
– V
SS
])
(6.)
Pulse Width Match between Circuits in the same
package
t
W
15
5.0
5.0
10
15
550
350
300
ns
t
W
10,000
10
5.0
10
15
15
10
15
30
50
55
45
90
95
μ
s
t1 – t2
10,000
10
5.0
10
15
6.0
8.0
8.0
25
35
35
%
Reset Propagation Delay — Reset to Q or Q
t
PLH
,
t
PHL
15
5.0
5.0
10
15
325
90
60
600
225
170
ns
1000
10
5.0
10
15
1000
300
250
ns
Retrigger Time
t
rr
15
5.0
5.0
10
15
0
0
0
ns
1000
10
5.0
10
15
0
0
0
ns
External Timing Resistance
R
X
C
X
5.0
1000
k
μ
F
External Timing Capacitance
No Limits
(7.)
6. R
X
is in Ohms, C
X
is in farads, V
DD
and V
SS
in volts, PW
out
in seconds.
7. If C
X
> 15
μ
F, Use Discharge Protection Diode D
X
, per Fig. 9.
8. The formulas given are for the typical characteristics only at 25 C.
9. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
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