參數(shù)資料
型號(hào): MC10H160MEL
廠商: ON SEMICONDUCTOR
元件分類: 通用總線功能
英文描述: 12−Bit Parity Generator−Checker
中文描述: 10H SERIES, 12-BIT PARITY GENERATOR/CHECKER, TRUE OUTPUT, PDSO16
封裝: EIAJ, SOP-16
文件頁(yè)數(shù): 2/6頁(yè)
文件大小: 157K
代理商: MC10H160MEL
MC10H160
http://onsemi.com
2
Table 1. MAXIMUM RATINGS
Symbol
Characteristic
Rating
Unit
V
EE
Power Supply (V
CC
= 0)
8.0 to 0
Vdc
V
I
Input Voltage (V
CC
= 0)
0 to V
EE
Vdc
I
out
Output Current
Continuous
Surge
50
100
mA
T
A
Operating Temperature Range
0 to +75
°
C
T
stg
Storage Temperature Range
Plastic
Ceramic
55 to +150
55 to +165
°
C
°
C
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Table 2. ELECTRICAL CHARACTERISTICS
(V
EE
=
5.2 V
±
5%) (Note 1)
0
°
25
°
75
°
Symbol
Characteristic
Min
Max
Min
Max
Min
Max
Unit
I
E
Power Supply Current
88
78
88
mA
I
inH
Input Current High
Pins 3,5,7,10,12,14
Pins 4,6,9,11,13,15
391
457
246
285
246
285
A
I
inL
Input Current Low
0.5
0.5
0.3
A
V
OH
High Output Voltage
1.02
0.84
0.98
0.81
0.92
0.735
Vdc
V
OL
Low Output Voltage
1.95
1.63
1.95
1.63
1.95
1.60
Vdc
V
IH
High Input Voltage
1.17
0.84
1.13
0.81
1.07
0.735
Vdc
V
IL
Low Input Voltage
1.95
1.48
1.95
1.48
1.95
1.45
Vdc
1. Each MECL 10H
series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is maintained.
Outputs are terminated through a 50 resistor to
2.0 V.
Table 3. AC PARAMETERS
0
°
25
°
75
°
Symbol
Characteristic
Min
Max
Min
Max
Min
Max
Unit
t
pd
Propagation Delay
1.1
3.1
1.1
3.3
1.2
3.5
ns
t
r
Rise Time
0.55
1.5
0.55
1.6
0.75
1.7
ns
t
f
Fall Time
0.55
1.5
0.55
1.6
0.75
1.7
ns
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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