參數(shù)資料
型號: MB86064PB-GE1
廠商: Fujitsu Semiconductor America Inc
文件頁數(shù): 1/4頁
文件大?。?/td> 0K
描述: DAC 14BIT 1GSA/S DUAL 12-EFBGA
應(yīng)用說明: MB8606x Op-Amp Output Circuit
MB8606x Varying Full-Scale Output Current
標(biāo)準(zhǔn)包裝: 1
位數(shù): 14
數(shù)據(jù)接口: LVDS,串行
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 模擬和數(shù)字
功率耗散(最大): 750mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 120-LBGA
供應(yīng)商設(shè)備封裝: 120-EFBGA(12x12)
包裝: 托盤
輸出數(shù)目和類型: 2
采樣率(每秒): *
產(chǎn)品目錄頁面: 1261 (CN2011-ZH PDF)
配用: 865-1012-ND - KIT DEV DUAL 14BIT MB86064 SMA
865-1010-ND - KIT DEB DUAL 14BIT DAC MB86064
其它名稱: 865-1007
DK86064-2
Copyright 2004-2008 Fujitsu Microelectronics Europe GmbH
Production
Page 1 of 4
Disclaimer: The contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales representatives before
ordering.The information and circuit diagrams in this document are presented “as is”, no license is granted by implication or otherwise.
Product Flyer
January 2008
Version 2.1
FME/MS/DAC80/FL_2/5084
Dual 14-bit 1GSa/s DAC Development Kit
Mixed Signal Division
DK86064-2 Evaluation Platform
Features
Development kit for MB86064
MB86064 Evaluation Board
PC USB Programming Cable
PC control software supplied on CD
- Win2000/XP compatible
User Manual
SMA data adaptors (optional)
Provides easy access to on-chip waveform
memories to perform initial performance tests,
avoiding need for high performance data
generating equipment
Description
The DK86064-2 development kit provides a
simple and effective means of evaluating the
MB86064 dual 14-bit 1GSa/s Digital to Analog
Converter (DAC).
A user manual provides a step-by-step guide
from configuring the board and connecting test
equipment, through to evaluating the MB86064
performance. Schematics, PCB overlays and
connector pin-outs are included. The evaluation
platform requires two DC power supplies, 1.8V &
3.3V, each capable of providing 1 amp.
The PC USB programming cable and control
software is included to configure and control the
device, as well as download test vectors to the
waveform memory module.
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