參數(shù)資料
型號: MAX6018
廠商: Maxim Integrated Products, Inc.
英文描述: ER 9C 9#16 SKT PLUG
中文描述: 高精度、微功耗、1.8V電源、低壓差、SOT23封裝電壓基準(zhǔn)
文件頁數(shù): 5/9頁
文件大小: 300K
代理商: MAX6018
M
Precision, Micropower, 1.8V Supply,
Low-Dropout, SOT23 Voltage Reference
_______________________________________________________________________________________
5
ELECTRICAL CHARACTERISTICS (MAX6018_21
2.048V)
(V
IN
= 2.25V; C
OUT
= 47nF, I
OUT
= 0; T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at T
A
= +25
°
C.) (Note 1)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
OUTPUT
MAX6018A_21 (0.2%)
MAX6018B_21 (0.4%)
(Note 2)
T
A
= +25
°
C
T
A
= +25
°
C
2.0439
2.0398
2.0480
2.0480
16
2.0521
2.0562
50
Output Voltage
V
OUT
V
Output Voltage Temperature Drift
TCV
OUT
V
OUT
/
V
IN
ppm/
o
C
Line Regulation
2.25V
V
IN
5.5V
45
330
μV/V
0
I
OUT
1mA
-1mA
I
OUT
0
I
OUT
= 1mA
Sourcing to GND
Sinking from V
IN
90
0.3
100
10
4
1000
50
200
μV/mA
μV/μA
mV
Load Regulation
V
OUT
/
I
OUT
V
IN
- V
OUT
Dropout Voltage (Note 3)
Short-Circuit Current
I
SC
mA
Long-Term Stability
V
OUT
/
Time
1000hrs at T
A
= +25
°
C
100
ppm
Thermal Hysteresis
DYNAMIC CHARACTERISTICS
(Note 4)
130
ppm
0.1Hz to 10Hz
10Hz to 10kHz
V
IN
= 2.25V ±100mV (f = 120Hz)
Settling to 0.1%; C
OUT
= 5nF
(Note 2)
50
175
85
200
μVp-p
μVRMS
dB
μs
nF
Noise Voltage
e
OUT
Ripple Rejection
Turn-On Settling Time
Capacitive-Load Stability Range
INPUT
Supply Voltage Range
t
R
C
OUT
0.1
1000
V
IN
Guaranteed by Line Regulation Test
T
A
= +25
°
C
T
A
= T
MIN
to T
MAX
2.25
5.5
5
6
V
3
3
Quiescent Supply Current
I
IN
μA
Change in Quiescent Supply
Current vs. Input Voltage
I
IN
/
V
IN
2.25V
V
IN
5.5V
0.1
0.5
μA/V
Note 1:
Devices are 100% production tested at T
A
= +25
°
C and are guaranteed by design from T
A
= T
MIN
to T
MAX
.
Note 2:
Not production tested. Guaranteed by design.
Note 3:
Dropout voltage is the minimum input voltage at which V
OUT
changes
0.2% from V
OUT
at rated V
IN
and is guaranteed by
Load Regulation Test.
Note 4:
Thermal hysteresis is defined as the change in T
A
= +25
°
C output voltage before and after temperature cycling of the device
(from T
A
= T
MIN
to T
MAX
). Initial measurement at T
A
= +25
°
C is followed by temperature cycling the device to T
A
= +85
°
C
then to T
A
= -40
°
C and another measurement at T
A
= +25
°
C is compared to the original measurement at T
A
= +25
°
C.
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