- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄383307 > MA31755 (Dynex Semiconductor Ltd.) 16-Bit Feedthrough Error Detection & Correction Unit EDAC PDF資料下載
參數(shù)資料
| 型號(hào)： | MA31755 |
| 廠商： | Dynex Semiconductor Ltd. |
| 英文描述： | 16-Bit Feedthrough Error Detection & Correction Unit EDAC |
| 中文描述： | 16位穿心錯(cuò)誤檢測(cè) |
| 文件頁(yè)數(shù)： | 12/13頁(yè) |
| 文件大?。?/td> | 134K |
| 代理商： | MA31755 |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)當(dāng)前第12頁(yè)第13頁(yè)
MA31755
12/13
8. RADIATION TOLERANCE
8.1 TOTAL DOSE RADIATION TESTING
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with Mil-Std-883 test method 1019, Ionizing
Radiation (Total Dose).
9. ORDERING INFORMATION
For details of reliability, QA/QC, test and assembly
options, see ‘Manufacturing Capability and Quality
Assurance Standards’ Section 9.
Unique Circuit Designator
S
R
Q
Radiation Hard Processing
100 kRads (Si) Guaranteed
300 kRads (Si) Guaranteed
Radiation Tolerance
A
F
Pin Grid Array
Flatpack (Solder Seal)
Package Type
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
Assembly Process
(See Section 9 Part 2)
L
C
D
E
B
S
Rel 0
Rel 1
Rel 2
Rel 3/4/5/STACK
Class B
Class S
Reliability Level
MAx31755xxxxx
Total Dose (Function to specification)*
5x10
5
Rad(Si)
Transient Upset (Stored data loss)
1x10
11
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
<1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 19: Radiation Hardness Parameters
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| MA3690 | 1553B Bus Controller/Remote Terminal |
| MA3691 | 1553B Bus Controller/Remote Terminal |
| MA3693 | 1553B Bus Controller/Remote Terminal |
| MA5114 | Radiation hard 1024x4 Bit Static RAM |
| MA7001 | Radiation Hard 512x9 Bit FIFO |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MA318 | 功能描述:CPU與芯片冷卻器 INTEL P111 FC-PGA RoHS:否 制造商:ADLINK Technology 尺寸: 電壓額定值: 功率額定值: 速度: 氣流: 系列: |
| MA3180 | 制造商:PANASONIC 制造商全稱:Panasonic Semiconductor 功能描述:Silicon planar type |
| MA3180-H | 制造商:PANASONIC 制造商全稱:Panasonic Semiconductor 功能描述:Silicon planar type |
| MA3180-L | 制造商:PANASONIC 制造商全稱:Panasonic Semiconductor 功能描述:Silicon planar type |
| MA3180-M | 制造商:PANASONIC 制造商全稱:Panasonic Semiconductor 功能描述:Silicon planar type |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。