參數(shù)資料
型號(hào): M75010
廠商: Electronic Theatre Controls, Inc.
英文描述: PHOTOELECTRIC SMOKE DETECTOR WITH INTERCONNECT
中文描述: 光電感煙探測(cè)器與互連
文件頁(yè)數(shù): 8/10頁(yè)
文件大?。?/td> 179K
代理商: M75010
8/10
2006-01-25
PHOTOELECTRIC SMOKE DETECTOR
WITH INTERCONNECT
SMOKE DETECTOR
M75010
一華半導(dǎo)體股份有限公司
MOSDESIGN SEMICONDUCTOR CORP.
AC ELECTRICAL CHARACTERISTICS
(TA=-25
~ 75
)
Characteristics
Sym.
V
DD
Min.
Typ.
Oscillator Period
T
OSC
9
9.4
10.5
T
LED1
9
39
T
LED2
9
None
T
LED3
9
0.45
0.50
Led Pulse Width
T
W (LED)
9
9.5
T
ST1
9
9.6
T
ST2
9
1.8
2.0
Max.
11.5
48
0.55
11.5
11.9
2.2
Unit
ms
s
s
s
ms
s
s
Conditions
No Local or Remote Smoke
Remote Smoke only
Local Smoke or Test
Led Pulse Period
No Local or Remote Smoke
After 1 or 3 Valid Samples
T
ST3
9
0.8
1.0
1.1
s
After 2 or 3 Valid Samples
and During Local Alarm
T
ST4
9
7.2
8.0
8.9
s
Remote Alarm
T
ST5
9
38.9
47.1
s
Chamber Test or Low Supply Test ,
No Local Alarm
Pushbutton Test , No Alarm
Strobe Pulse Period
T
ST6
T
W (ST)
T
IRED1
T
IRED2
9
9
9
9
300
9.5
9.6
1.8
336
2.0
370
11.5
11.9
2.2
ms
ms
s
s
Strobe Pulse Width
No Local or Remote Smoke
After 1 or 3 Valid Samples
T
IRED3
9
0.8
1.0
1.1
s
After 2 or 3 Valid Samples
and During Local Alarm
T
IRED4
T
IRED5
T
IRED6
T
W (IRED)
T
r
(IRED)
T
f
(IRED)
T
d
(IO)
9
9
9
9
7.2
38.9
300
94
8.0
336
0
1.0
8.9
47.1
370
116
30
200
s
s
Remote Alarm
Chamber Test , No Local Alarm
Pushbutton Test , No Alarm
I
RED
Pulse Period
ms
μ
s
μ
s
μ
s
s
s
s
I
RED
Pulse Width
I
RED
Rise Time
I
RED
Fall Time
I/O to Active Delay
I/O Charge Dump Duration T
dump
Rising Edge on I/O to Alarm
10% to 90%
90% to 10%
Local Alarm
End of Local Alarm or Test
No Local Alarm
Low Supply and Degraded
Chamber Sensitivity
9
9
9
0.9
1.1
1.34
T
r
(IO)
Horn Warning Pulse Period T
HORN
9
38.9
47.1
s
Horn Warning Pulse Width T
W
(HORN)
9
9.5
11.5
ms
Low Supply and Degraded
Chamber Sensitivity
Local or Remote Alarm
Local or Remote Alarm
Horn ON Time
Horn OFF Time
T
ON
(HORN)
T
OFF
(HORN)
9
9
216
80
280
83
ms
ms
* Limits over the operating temperature range are based on characterization data.
Characteristics are production tested at +25
.
Typical values are at +25
and are given for circuit design information only.
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