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參數(shù)資料
| 型號： | M37702S1LHP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 16-BIT, 8 MHz, MICROCONTROLLER, PQFP80 |
| 封裝： | 0.50 MM PITCH, FINE PITCH, PLASTIC, QFP-80 |
| 文件頁數(shù)： | 5/20頁 |
| 文件大?。?/td> | 272K |
| 代理商： | M37702S1LHP |
13
MITSUBISHI MICROCOMPUTERS
M37702M2LXXXGP, M37702S1LGP
M37702M2LXXXHP, M37702S1LHP
SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER
Limits
Symbol
Parameter
Unit
td(E–P0Q)
td(E–P1Q)
td(E–P2Q)
td(E–P3Q)
td(E–P4Q)
td(E–P5Q)
td(E–P6Q)
td(E–P7Q)
td(E–P8Q)
Port P0 data output delay time
Port P1 data output delay time
Port P2 data output delay time
Port P3 data output delay time
Port P4 data output delay time
Port P5 data output delay time
Port P6 data output delay time
Port P7 data output delay time
Port P8 data output delay time
ns
Single-chip mode
Min.
Max.
300
Limits
Symbol
Parameter
Unit
td(P0A–E)
td(E–P1Q)
tPXZ(E–P1Z)
td(P1A–E)
td(P1A–ALE)
td(E–P2Q)
tPXZ(E–P2Z)
td(P2A–E)
td(P2A–ALE)
td(
φ1–HLDA)
td(ALE–E)
tW(ALE)
td(BHE–E)
td(R/W–E)
td(E–
φ1)
th(E–P0A)
th(ALE–P1A)
th(E–P1Q)
tPZX(E–P1Z)
th(E–P1A)
th(ALE–P2A)
th(E–P2Q)
tPZX(E–P2Z)
th(E–BHE)
th(E–R/W)
tW(EL)
Port P0 address output delay time
Port P1 data output delay time (BYTE = “L”)
Port P1 floating start delay time (BYTE = “L”)
Port P1 address output delay time
Port P2 data output delay time
Port P2 floating start delay time
Port P2 address output delay time
_____
HLDA output delay time
ALE output delay time
ALE pulse width
____
BHE output delay time
__
R/W output delay time
φ1 output delay time
Port P0 address hold time
Port P1 address hold time (BYTE = “L”)
Port P1 data hold time (BYTE = “L”)
Port P1 floating release delay time (BYTE = “L”)
Port P1 address hold time (BYTE = “H”)
Port P2 address hold time
Port P2 data hold time
Port P2 floating release delay time
____
BHE hold time
__
R/W hold time
_
E pulse width
ns
Memory expansion mode and microprocessor mode (when wait bit = “0”, and external memory area is accessed)
Min.
50
40
50
40
4
60
50
0
50
9
50
95
50
9
50
95
18
460
Max.
130
10
130
10
120
40
SWITCHING CHARACTERISTICS (VCC = 2.7 to 5.5 V, VSS = 0 V, Ta = 25 °C, f(XIN) = 8 MHz, unless otherwise noted)
Test conditions
Fig. 4
Test conditions
Fig. 4
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