參數(shù)資料
型號(hào): M27C512-45XF6X
廠商: STMICROELECTRONICS
元件分類: PROM
英文描述: 64K X 8 UVPROM, 45 ns, CDIP28
封裝: FRIT SEALED, WINDOWED, CERAMIC, DIP-28
文件頁數(shù): 13/18頁
文件大小: 115K
代理商: M27C512-45XF6X
M27C512
4/18
DEVICE OPERATION
The modes of operations of the M27C512 are list-
ed in the Operating Modes table. A single power
supply is required in the read mode. All inputs are
TTL levels except for GVPP and 12V on A9 for
Electronic Signature.
Read Mode
The M27C512 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
dresses are stable, the address access time
(tAVQV) is equal to the delay from E to output
(tELQV). Data is available at the output after a delay
of tGLQV from the falling edge of G, assuming that
E has been low and the addresses have been sta-
ble for at least tAVQV-tGLQV.
Standby Mode
The M27C512 has a standby mode which reduces
the active current from 30mA to 100
AThe
M27C512 is placed in the standby mode by apply-
ing a CMOS high signal to the E input. When in the
standby mode, the outputs are in a high imped-
ance state, independent of the GVPP input.
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
≤ 10ns
≤ 20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Figure 3. Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance (1) (TA =25 °C, f = 1 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol
Parameter
Test Conditio n
Min
Max
Unit
CIN
Input Capacitance
VIN =0V
6pF
COUT
Output Capacitance
VOUT =0V
12
pF
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