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參數(shù)資料
| 型號： | M0002947 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | MN54ABT646-X REV 0B0 |
| 中文描述： | MN54ABT646 - X活0B0 |
| 文件頁數(shù)： | 1/9頁 |
| 文件大?。?/td> | 18K |
| 代理商： | M0002947 |
Original Creation Date: 08/25/95
Last Update Date: 10/05/98
Last Major Revision Date: 03/19/97
MN54ABT646-X REV 0B0
MICROCIRCUIT DATA SHEET
OCTAL TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
General Description
The ABT646 consists of bus tranceiver circuits wit TRI-STATE, D-type flip-flops, and
control circuitry arranged for multiplexed transmission of data directly from the input
bus or from the internal registers. Data on the A or B bus will be clocked into the
registers as the appropriate clock pin goes to a high logic level. Control OE and
direction pins are provided to control the transceiver function. In the transceiver mode,
data present at the high impedance port may be stored in either the A or the B register or
in both. The select controls can mutiplex stored and real-time (transparent mode) data.
The direction control determines which bus will receive data when the enable control OE is
Active LOW. In the isolation mode (control OE HIGH), A data may be stored in the B
register and/or B data may be stored in the A register.
NS Part Numbers
54ABT646E-QML *
54ABT646J-QML **
54ABT646W-QML ***
Industry Part Number
54ABT646
Prime Die
NB646
Controlling Document
See Features Page
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
1
2
3
4
5
6
7
8A
8B
9
10
11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
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