
Microsemi
Linfinity Microelectronics Division
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 5
Copyright
2001
Rev. 1.2,2004-02-02
WWW
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.CO
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AudioMAX
LX1721 / 1722
Class-D Stereo Power Amplifier Controller
PRODUCTION
I N T E GRA T ED
PR ODUC T S
ELECTRICAL CHA RACTERISTICS (CONTINUED)
LX1721 / 1722
Parameter
Symbol
Test Conditions
Min
Typ
Max
Units
Current Limit Comparator
Voltage Sense Threshold
190
210
230
mV
Blanking Pulse Delay
500
‘ns
Response Time
Excluding blanking pulse
250
‘ns
IUM Pulses required to Current Limit
Latch
4
‘cycles
Consecutive Clear Pulses required to
reset IUM counter
2
‘cycles
Reference Voltage Section
Initial Accuracy
(VREF)
5.0
Voltage Stability
(VREF)
± 50
± 100
‘mV
Initial Accuracy
(V25)
2.5
Voltage Stability
(V25)
± 25
± 50
mV
Temperature Stability
TA = 0
OC to 70OC
2
5
‘mV
Line Regulation
VDD = 9V to 15V
0.5
‘mV
Load Regulation
IOUT = 0 to 10mA
5
‘mV
Under Voltage Lockout Section
Start Threshold Voltage
6
V
UV Lockout Hysteresis
250
mV
UVLO Delay To Output Enable
62,500
clkcyc
Supply Current
Sleep Current
SLEEP Input = 0V, TA = 25
OC
30
A
Operating Current
SLEEP Input = 2V, VIN = 15V,
No MOSFETs connected
8
11
‘mA
Sleep to Output Enable
62,500
clkcyc
Sleep Threshold
1.45
1.6
1.75
V
Mute Section
Mute Threshold
1.2
1.35
1.5
V
Output Drivers For N-Channel MOSFETs
ISINK = 3mA
30
100
‘mV
NFET Drivers, Low Level Voltage
VOL
ISINK = 100mA
0.3
1.0
V
ISOURCE = 3mA, CN = 5.2V
applied externally
30
100
‘mV
NFET Drivers, High Level Voltage
VOH
ISOURCE = 100mA, CN = 5.2V
applied externally
0.3
1.0
V
Output Drives For P-Channel MOSFETs
ISINK = 3mA
30
100
‘mV
PFET Drivers, Low Level Voltage
VOL
ISINK = 100mA
0.5
1.0
V
ISOURCE = 3mA, CP = 5.2V
(applied externally)
30
100
‘mV
PFET Drivers, High Level Voltage
VOH
ISOURCE = 100mA, CP = 5.2V
(applied externally)
0.5
1.0
V
Note 2: The LX1721 / 22CDB is guaranteed to meet performance specifications from 0° to 70°C. Specifications over the -20° to 0°C operation temperature
range are assured by design, characterization, and statistical process control.
EE
LL
EE
CC
TT
RR
IICC
AA
LL
SS