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參數(shù)資料
| 型號： | LW101 |
| 廠商： | Seoul Semicondutctor Inc. |
| 英文描述： | INFRARED LAMP LED |
| 中文描述： | 紅外發(fā)光二極管燈 |
| 文件頁數(shù)： | 5/14頁 |
| 文件大小： | 301K |
| 代理商： | LW101 |
-5-
SEOUL SEMICONDUCTOR CO., LTD.
148-29, Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL : 82-2-3281-6269 FAX : 82-2-857-5430
<050201> Rev. 0.0
LI521
5. RELIABLITY TESTS
0/50
100cycles
T
a
= -40oC (25min) ~ 25oC (5min) ~
105oC (25min) ~ 25oC (5min)
Temperature Cycle
0/22
1 time
1kV, 1.5k
Ω
; 100pF
ESD
(Human Body Model)
0/50
100cycles
T
a
= -40oC (30min) ~ 105o (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
Thermal Shock
0/22
100hrs
T
a
= 85oC,
RH
= 85%
I
F
= 15mA
Temperature Humidity
Operating
0/50
1000hrs
T
a
= 85oC,
RH
= 85%
Temperature Humidity
Storage
0/50
1000hrs
T
a
= -40oC
Low Temperature
Storage
0/50
1000hrs
T
a
= 105oC
High Temperature
Storage
0/50
0/50
0/22
0/22
0/22
Failures
10cycles
T
a
= 25oC ~ 65oC ~ -10oC,
RH
= 90%
(1Cycle = 24hrs)
Moisture Resistance
Cycle
1 time
T
s
= 260
±
5oC,
t
= 10
±
1sec
Resistance to soldering
Heat
1000hrs
T
a
= 100oC,
I
F
= 10mA
High Temperature
Operating
1000hrs
T
a
= -40oC,
I
F
= 20mA
Low Temperature
Operating
1000hrs
T
a
= RT,
I
F
= 50mA
Life Test
Note
Condition
Item
< Judging Criteria For Reliability Tests >
LSL
2
X
0.7
I
V
USL
X
2.0
I
R
USL
1
X
1.2
V
F
Notes : 1. USL : Upper Standard Level 2. LSL : Lower Standard Level.
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