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參數(shù)資料
| 型號(hào)： | LTC2414IGN#TRPBF |
| 廠(chǎng)商： | Linear Technology |
| 文件頁(yè)數(shù)： | 15/48頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 8CH 24BIT DIFFINPUT28SSOP |
| 標(biāo)準(zhǔn)包裝： | 2,500 |
| 位數(shù)： | 24 |
| 采樣率（每秒）： | 7.5 |
| 數(shù)據(jù)接口： | MICROWIRE?，串行，SPI? |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 功率耗散（最大）： | 1mW |
| 電壓電源： | 單電源 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類(lèi)型： | 表面貼裝 |
| 封裝/外殼： | 28-SSOP（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 28-SSOP |
| 包裝： | 帶卷 (TR) |
| 輸入數(shù)目和類(lèi)型： | 8 個(gè)單端，單極；8 個(gè)單端，雙極；4 個(gè)差分，單極；4 個(gè)差分，雙極 |
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LTC2414/LTC2418
22
241418fa
When testing EOC, if the conversion is complete (EOC = 0),
the device will exit the low power mode during the EOC
test. In order to allow the device to return to the low power
sleep state, CS must be pulled HIGH before the first rising
edge of SCK. In the internal SCK timing mode, SCK goes
HIGH and the device begins outputting data at time tEOCtest
after the falling edge of CS (if EOC = 0) or tEOCtest after EOC
goes LOW (if CS is LOW during the falling edge of EOC).
The value of tEOCtest is 23s if the device is using its internal
oscillator (FO = logic LOW or HIGH). If FO is driven by an
external oscillator of frequency fEOSC, then tEOCtest is
3.6/fEOSC. If CS is pulled HIGH before time tEOCtest, the
device returns to the sleep state and the conversion result
is held in the internal static shift register.
If CS remains LOW longer than tEOCtest, the first rising
edge of SCK will occur and the conversion result is serially
shifted out of the SDO pin. The data I/O cycle concludes
after the 32nd rising edge. The input data is then shifted in
via the SDI pin on the rising edge of SCK (including the first
rising edge) and the output data is shifted out of the SDO
pin on each falling edge of SCK. The internally generated
serial clock is output to the SCK pin. This signal may be
used to shift the conversion result into external circuitry.
EOC can be latched on the first rising edge of SCK and the
last bit of the conversion result on the 32nd rising edge of
SCK. After the 32nd rising edge, SDO goes HIGH (EOC =
1), SCK stays HIGH and a new conversion starts.
Typically, CS remains LOW during the data output state.
However, the data output state may be aborted by pulling
CS HIGH anytime between the first and 32nd rising edge
of SCK, see Figure 9. On the rising edge of CS, the device
aborts the data output state and immediately initiates a
new conversion. If the device has not finished loading the
last input bit A0 of SDI by the time CS is pulled HIGH, the
address information is discarded and the previous ad-
dress is still kept. This is useful for systems not requiring
all 32 bits of output data, aborting an invalid conversion
cycle, or synchronizing the start of a conversion. If CS is
pulled HIGH while the converter is driving SCK LOW, the
internal pull-up is not available to restore SCK to a logic
HIGH state. This will cause the device to exit the internal
serial clock mode on the next falling edge of CS. This can
be avoided by adding an external 10k pull-up resistor to
the SCK pin or by never pulling CS HIGH when SCK is LOW.
APPLICATIO S I FOR ATIO
WU
UU
Figure 8. Internal Serial Clock, Single Cycle Operation
(1)
(0)
EN
SGL
A2
A1
A0
ODD/
SIGN
SDI
DON’T CARE
SDO
SCK
(INTERNAL)
CS
MSB
SIG
BIT 0
LSB
PARITY
BIT 6
TEST EOC
BIT 27
BIT 26
BIT 25
BIT 24
BIT 28
BIT 29
BIT 30
EOC
BIT 31
SLEEP
DATA OUTPUT
CONVERSION
241418 F08
<tEOCtest
Hi-Z
TEST EOC
VCC
FO
REF+
REF–
CH0
CH7
CH8
CH15
COM
SCK
SDI
SDO
CS
GND
919
11
12
21
28
1
8
10
18
17
15
16
20
REFERENCE
VOLTAGE
0.1V TO VCC
ANALOG
INPUTS
= 50Hz REJECTION
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
VCC
1
F
2.7V TO 5.5V
LTC2414/
LTC2418
4-WIRE
SPI INTERFACE
VCC
10k
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