參數(shù)資料
型號(hào): LP5527
廠商: National Semiconductor Corporation
英文描述: Tiny LED Driver for Camera Flash and 4 LEDs with I2C Programmability, Connectivity Test and Audio Synchronization
中文描述: 微小的LED照相機(jī)閃光燈和4的I2C可編程性,連接測(cè)試和音頻同步發(fā)光二極管驅(qū)動(dòng)器
文件頁(yè)數(shù): 18/21頁(yè)
文件大?。?/td> 829K
代理商: LP5527
Test Interface
(Continued)
20184020
Test Interface Timing Diagram
Test Interface Timing Parameters
Symbol
1
2
3
4
5
NOTE:
Data guaranteed by design
Condition
V
DD1,2
= 4.2V
Parameter
Limit
Units
ms
μs
μs
μs
ns
Min
1
200
200
Max
Setup Time after V
DD1,2
= 4.2V
Clock High Time
Clock Low Time
Test Result Settling Time
Data Hold Time
10
10
0
Test Interface Characteristics
Limits in standard typeface are for T
J
= 25
o
C.
Symbol
Parameter
Logic Input T1
V
IL
Input Low Level
V
IH
Input High Level
Logic Output T2
V
OL
Output Low Level
Condition
Min
Typ
Max
Units
V
DD1,2
= 4.2V
0.5
V
V
1.2
V
DD1,2
= 4.2V, I
OUT
= 3 mA
(pull-up current)
V
DD1,2
=4.2V, I
OUT
= -3 mA
(pull-down current)
0.3
0.5
V
V
OH
Output High Level
V
DD1,2
- 0,5
3.9
V
Internal Current Sink
I
SINK
Connectivity Test Pass Range
V
PASS1
Voltage Over the Internal
Current Sink; Low Level
V
PASS2
Voltage Over the Internal
Current Sink; High Level
V
PASS3
Voltage Over the Internal
Current Sink; Low Level
V
PASS4
Voltage Over the Internal
Current Sink; High Level
NOTE:
Data guaranteed by design
Sink Current
V
DD1,2
= 4.2V
500
μA
Production test cases
V
DD1,2
= 4.2V
V
OUT
= 3.9V to 4.2V
0.05
-50
2.03
-30
-30%
0.10
0.16
+60
3.77
+30
+30%
V
%
V
%
V
2.90
Field test cases
V
DD1,2
= 3.0V...4.2V
V
OUT
= 5.0V
±
5%
0.40
-10%
3.95
+10%
V
L
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