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參數(shù)資料
| 型號(hào)： | LM12H458MW/883 |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 模擬信號(hào)調(diào)理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, CQFP44 |
| 封裝： | CERQUAD-44 |
| 文件頁數(shù)： | 1/12頁 |
| 文件大?。?/td> | 174K |
| 代理商： | LM12H458MW/883 |
Original Creation Date: 09/14/95
Last Update Date: 09/25/95
Last Major Revision Date: 09/14/95
MNLM12H458M-X REV 0A0
MILITARY DATA SHEET
12-BIT + SIGN DATA ACQUISTITION SYSTEM WITH
SELF-CALIBRATION
General Description
The LM12H458 is a highly integrated Data Acquisition System. Operating on just 5V, it
combines a fully-differential self-calibrating (correcting linearity and zero errors)
13-bit (12-bit + sign) analog-to-digital converter (ADC) and sample-and-hold (S/H) with
extensive analog functions and digital functionality. Up to 32 consecutive conversions,
using two's complement format, can be stored in an internal 32-word (16-bit wide) FIFO
data buffer. An internal 8-word RAM can store the conversion sequence for up to eight
acquisitions through the LM12H458's eight-input multiplexer. The LM12H458 can also operate
with 8-bit + sign resolution and in a supervisory (watchdog) mode that compares an input
signal against two programmable limits.
Programmable acquisition times and conversion rates are possible through the use of
internal clock-driven timers. The reference voltage input can be externally generated for
absolute or ratiometric operation or can be derived using the internal 2.5V bandgap
reference.
All registers, RAM, and FIFO are directly addressable through the high speed
microprocessor interface to either an 8-bit or 16-bit databus. The LM12H458 includes a
direct memory access (DMA) interface for high-speed conversion data transfer.
NS Part Numbers
LM12H458MEL/883
LM12H458MW/883
Industry Part Number
LM12H458M
Prime Die
LM12458
Controlling Document
5962-9319502MXC, MYA
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching
tests at
+25
10
Switching
tests at
+125
11
Switching
tests at
-55
1
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