參數(shù)資料
型號(hào): LA75600VA
廠商: Sanyo Electric Co.,Ltd.
英文描述: Monolithic Linear IC IF Signal Processing (VIF/SIF) IC for use in TV/VCR Applications
中文描述: 單片線性集成電路中頻信號(hào)處理(資料表格/應(yīng)力強(qiáng)度因子)集成電路使用的電視/錄像機(jī)應(yīng)用
文件頁(yè)數(shù): 5/16頁(yè)
文件大?。?/td> 398K
代理商: LA75600VA
LA75600VA
No.A0325-5/17
Test Conditions
V1. Circuit current
……
[I5]
(1) Internal AGC
(2) Input a 45.75MHz 10mVrms continuous wave to the VIF input pin.
(3) RF AGC Vr MAX
(4) Connect an ammeter to the VCC and measure the incoming current.
V2. V3. Maximum RF AGC voltage, Minimum RF AGC voltage
……
[V14H, V14L]
(1) Internal AGC
(2) Input a 45.75MHz 10mVrms continuous wave to the VIF input pin.
(3) Adjust the RF AGC Vr (resistance value max.) and measure the maximum RF AGC voltage. (F)
(4) Adjust the RF AGC Vr (resistance value min.) and measure the minimum RF AGC voltage. (F)
V4. Input sensitivity
……
[Vi]
(1) Internal AGC
(2) fp = 45.75MHz 15kHz 78% AM (VIF input)
(3) Turn off the S1 and put 100k
through.
(4) VIF input level at which the 400Hz detection output level at test point A becomes 0.64Vp-p.
V5. AGC range
……
[GR]
(1) Apply the VCC voltage to the external AGC, IF AGC (pin 17).
(2) In the same manner under the same conditions as for V4 (input sensitivity), measure the VIF input level at which
the detection output level becomes 0.64Vp-p
Vil.
(3)
V6. Maximum allowable input
……
[Vi max]
(1) Internal AGC
(2) fp = 45.75MHz 15kHz 78% AM (VIF input)
(3) VIF input level at which the detection output level at test point A becomes video output (VO)
±
1dB.
V7. No-signal video output voltage
……
[V6]
(1) Apply the VCC voltage to the external AGC, IF AGC (pin 17).
(2) Measure the DC voltage at the VIDEO output (A).
V8. Sync. signal tip voltage
……
[V6tip]
(1) Internal AGC
(2) Input a 45.75MHz 10mVrms continuous wave to the VIF input pin.
(3) Measure the DC voltage at the VIDEO output (A).
V9. Video output level
……
[VO]
(1) Internal AGC
(2) fp = 45.75MHz 15kHz 78% AM Vi = 10mVrms (VIF input)
(3) Measure the peak value of the detection output level at test point A. (Vp-p)
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