參數(shù)資料
型號: L9347PD
廠商: 意法半導體
英文描述: CAP CER 150PF 3.15KVDC R3 RAD
中文描述: 智能四2X5A/2X2.5A低邊開關(guān)
文件頁數(shù): 11/21頁
文件大小: 329K
代理商: L9347PD
11/21
L9347
set on error and all power outputs are shut off. The status signals remain in their state until the clock signal is
present again. A clock failure during power on of VCC is detected only on the regulated channels. The status
outputs of the channel 1 and 2 are low in this case.
1.7
The drift detection is used to compare the two regulated channels during regulation. This “Drift” test compares
the output PWM of the regulators. The resistivity of the load influences the output PWM. The approximated for-
mula for the output current below shows the dependency of the load resistor to the output PWM. In this formula
the energy reduction during the recirculation is not taken into account. The real output PWM is higher. The test-
mode is enabled with IN,EN and TEST high. With an identical 2kHz PWM-Signal connected to the IN-inputs the
output PWM must be in a range of +-14.3%. If the difference between the two on-times is more than ±14.3% of
the expected value an error is detected and monitored by the status outputs, in the same way as described
above, but a drift error will not be registered and also not delayed with T
D
as other errors
Drift Detection (regulated channels only)
A 7bit output-PWM-register is used for the comparison. The register with the lower value is subtracted from the
higher one. This result is multiplied by four and compared with the higher value.
1.8
The test pin is also used to test the regulated channels in the production. With a special sequence on this pin
the power stages of the regulated channels can be controlled direct from the input. No status feedback of the
regulated channels is given. The status output is clocked by the regulator logic. The output sequence is a indi-
cation of a proper logic functionality. The following table shows the functionality of this special test mode
Other Test modes
For more details about the test condition four see timing diagram.
EN
IN
TEST
OUT
STATUS
Note
1
X
X
X
X
disable test mode
1
1
1
on
1
Drift mode
0
X
off
test pattern
test condition one
0
X
off
test pattern
test condition two
0
X
off
test pattern
test condition three
0
0
off
test pattern
test condition four
0
1
on
test pattern
test condition four
IOUT
RON
--------+
PWM
=
Drift Definition:
Drift = PWM(1+E) - PWM (1-E) = 2PWM E
Drift * 4 < PWM (1+E)
with E >14.3% a drift is detected
E.. not correlated Error of the channels
%PWM ... Corresponding ideal output PWM to a given input PWM
相關(guān)PDF資料
PDF描述
L9347DIE1 INTELLIGENT QUAD 2X5A/2X2.5A LOW-SIDE SWITCH
L9348 CAP CER 1500PF 3.15KVDC R3 RAD
L9348-DIE1 Relay, DPDT, 16 Amp, Dual Coil,24A RoHS Compliant: Yes
L9349 CAP CER 180PF 3.15KVDC R3 RAD
L9349DIE1 QUAD INTELLIGENT POWER LOW SIDE SWITCH
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L9348-DIE1 制造商:STMICROELECTRONICS 制造商全稱:STMicroelectronics 功能描述:QUAD LOW SIDE DRIVER
L9348-TR 功能描述:功率驅(qū)動器IC QUAD Lo SIDE DRIVER RoHS:否 制造商:Micrel 產(chǎn)品:MOSFET Gate Drivers 類型:Low Cost High or Low Side MOSFET Driver 上升時間: 下降時間: 電源電壓-最大:30 V 電源電壓-最小:2.75 V 電源電流: 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:SOIC-8 封裝:Tube
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