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  • 參數(shù)資料
    型號(hào): KMPC8264AZUPIBB
    廠商: Freescale Semiconductor
    文件頁(yè)數(shù): 4/50頁(yè)
    文件大?。?/td> 0K
    描述: IC MPU PWRQUICC II HIP4 480-TBGA
    標(biāo)準(zhǔn)包裝: 2
    系列: MPC82xx
    處理器類(lèi)型: 32-位 MPC82xx PowerQUICC II
    速度: 200MHz
    電壓: 2V
    安裝類(lèi)型: 表面貼裝
    封裝/外殼: 480-LBGA
    供應(yīng)商設(shè)備封裝: 408-TBGA(37.5x37.5)
    包裝: 托盤(pán)
    MPC8260A PowerQUICC II Integrated Communications Processor Hardware Specifications, Rev. 2.0
    12
    Freescale Semiconductor
    Electrical and Thermal Characteristics
    2.2
    Thermal Characteristics
    Table 4 describes thermal characteristics.
    2.3
    Power Considerations
    The average chip-junction temperature, TJ, in °C can be obtained from the following:
    TJ = TA + (PD x θJA)
    (1)
    where
    TA = ambient temperature °C
    θ
    JA = package thermal resistance, junction to ambient, °C/W
    PD = PINT + PI/O
    PINT = IDD x VDD Watts (chip internal power)
    PI/O = power dissipation on input and output pins (determined by user)
    For most applications PI/O < 0.3 x PINT. If PI/O is neglected, an approximate relationship between PD and
    TJ is the following:
    PD = K/(TJ + 273° C)
    (2)
    Solving equations (1) and (2) for K gives:
    K = PD x (TA + 273° C) + θJA x PD
    2
    (3)
    2 The leakage current is measured for nominal VDD, VCCSYN, and VDD.
    3 MPC8265 and MPC8266 only.
    Table 4. Thermal Characteristics for 480 TBGA Package
    Characteristics
    Symbol
    Value
    Unit
    Air Flow
    Junction to ambient
    θJA
    131
    1 Assumes a single layer board with no thermal vias
    °C/W
    NC2
    2 Natural convection
    1 m/s
    113
    3 Assumes a four layer board
    NC
    83
    1 m/s
    Junction to board4
    4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is
    measured on the top surface of the board near the package.
    θJB
    4
    °C/W
    Junction to case5
    5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
    SPEC-883 Method 1012.1).
    θJC
    1.1
    °C/W
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