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參數(shù)資料
| 型號： | KA2213 |
| 廠商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | 1 Chip Tape Recorder(單片磁帶錄音機) |
| 中文描述： | 1芯片錄音機（單片磁帶錄音機） |
| 文件頁數(shù)： | 3/5頁 |
| 文件大小： | 111K |
| 代理商： | KA2213 |
KA2213 1 CHIP TAPE RECORDER
TEST CIRCUIT
Fig. 2
TEST METHOD
1
2
3
4
5
6
7
11
12
13
14
8
9
10
EQ
ALC
AMP
A
B
C
C
D
470u
10K
SW6
3.9K
SW8
SW7
680
BPF
4.7u
IN60x2
47u
100K
56
47K
SW5
22u
0.33u
10u
51K
SW2
30K
51
100u
100u
0.15u
470u
R
L
SW1
SW3
600
10P
R
G
SG
2.2K
4.7u
220u
470u
470u
Vcc
H/S
Characteristic
SW1
SW2
SW3
SW4
SW5
SW6
SW7
SW8
Test
Point
Test Method
I
CCQ
on
on
off
on
on
off
off
Test circuit current
G
VC
2
off
off
off
on
on
off
off
A.D
G
VC
= 20 log V
O
/V
I
(dB)
P
O
2
off
off
off
on
on
off
off
D
Test output voltage at THD = I0%
THD
2
off
off
off
on
on
off
off
D
Test THD at output voltage V
O
= 1V
V
NO
on
off
off
on
on
off
off
D
Test output noise voltage
RR
on
off
off
on
on
off
off
D
RR = 20 log V
RO
/150 (dB)
Test output ripple voltage (V
RO
)
G
VO
1
off
off
on
off
on
off
off
A.B
G
VO
=2o logV
O
/V
I
(dB)
V
O
1
off
off
off
on
on
off
off
B
Test output voltage at THD=1%
V
NI
off
on
off
on
on
on
off
C
Convert output noise voltage
at R
G
=2.2K
, V
NI
=V
NO
/G
V
V
I(ALC)
1
off
off
off
off
off
off
on
A.B
Test input voltage at THD = 1%
P
P
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