參數(shù)資料
型號: K4S281632D-NC75
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 128Mbit SDRAM 2M x 16Bit x 4 Banks Synchronous DRAM LVTTL
中文描述: 128Mbit SDRAM的200萬× 16 × 4銀行同步DRAM LVTTL
文件頁數(shù): 5/11頁
文件大?。?/td> 112K
代理商: K4S281632D-NC75
CMOS SDRAM
K4S281632D
Rev. 0.1 Sept. 2001
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
Voltage on any pin relative to Vss
V
IN
, V
OUT
-1.0 ~ 4.6
V
Voltage on V
DD
supply relative to Vss
V
DD
, V
DDQ
-1.0 ~ 4.6
V
Storage temperature
T
STG
-55 ~ +150
°
C
Power dissipation
P
D
1
W
Short circuit current
I
OS
50
mA
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Note :
DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
= 0 to 70
°
C)
Parameter
Symbol
Min
Typ
Max
Unit
Note
Supply voltage
V
DD
, V
DDQ
3.0
3.3
3.6
V
4
Input logic high voltage
V
IH
2.0
3.0
V
DD
+0.3
V
1
Input logic low voltage
V
IL
-0.3
0
0.8
V
2
Output logic high voltage
V
OH
2.4
-
-
V
I
OH
= -2mA
Output logic low voltage
V
OL
-
-
0.4
V
I
OL
= 2mA
Input leakage current
I
LI
-10
-
10
uA
3
1. V
IH
(max) = 5.6V AC.The overshoot voltage duration is
3ns.
2. V
IL
(min) = -2.0V AC. The undershoot voltage duration is
3ns.
3. Any input 0V
V
IN
V
DDQ
,
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
4. The VDD condition of K4S281632D-60 is 3.135V~3.6V.
Notes :
CAPACITANCE
(V
DD
= 3.3V, T
A
= 23
°
C, f = 1MHz, V
REF
=1.4V
±
200
mV)
Pin
Symbol
Min
Max
Unit
Note
Clock
C
CLK
2.5
4.0
pF
1
RAS, CAS, WE, CS, CKE, DQM
C
IN
2.5
5.0
pF
2
Address
C
ADD
2.5
5.0
pF
2
DQ
0
~ DQ
15
C
OUT
4.0
6.5
pF
3
1. -75/7C specify a maximum value of 3.5pF
2. -75/7C specify a maximum value of 3.8pF
3. -75/7C specify a maximum value of 6.0pF
Notes :
相關PDF資料
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