參數(shù)資料
型號(hào)： JANKCB2N2484
廠商： 意法半導(dǎo)體
英文描述： JT 16C 16#16 PIN WALL RECP
中文描述： 半導(dǎo)體器件，晶體管，npn型，硅，低功耗類(lèi)型2N2484，2N2484UA，2N2484UB 1月，JANTX，JANTXV，揚(yáng)斯，JANHC和JANKC
文件頁(yè)數(shù)： 11/19頁(yè)
文件大?。?/td> 113K
代理商： JANKCB2N2484
MIL-PRF-19500/376E
11
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX, and JANTXV, samples shall be selected randomly from a minimum of three wafers (or
from each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection
lot. See MIL-PRF-19500.
b.
Must be chosen from an inspection lot that has been submitted to and passed group A, subgroup 2
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table VII of MIL-PRF-19500, and in 4.4.3.1 (JANS).and 4.4.3.2 (JAN, JANTX, and JANTXV)
herein for group C testing. Electrical measurements (end-points) shall be in accordance with group A, subgroup 2
herein. Delta requirements shall be in accordance with table III herein.
4.4.3.1 Group C inspection, table VII (JANS) of MIL-PRF-19500.
Subgroup
Method Condition
C2
2036
Test condition E (not applicable to UA and UB suffix devices).
C6
1026
1,000 hours at V
CB
= 10 -30 V dc; power shall be applied to achieve T
J
= 150
°
C minimum
and a minimum power dissipation P
D
= 75 percent of maximum rated P
T
as defined in 1.3
herein.
4.4.3.2 Group C inspection, table VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method Condition
C2
2036
Test condition E (not applicable to UA and UB suffix devices).
C6
Not applicable.
4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes group A tests for conformance inspection. Testing of a subgroup using a single device
type enclosed in the intended package type shall be considered as complying with the requirements for that
subgroup.
4.4.4 Group E inspection. Group E inspection shall be performed for qualification or re-qualification only. The
tests specified in table II herein must be performed to maintain qualification.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-
750.
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