參數(shù)資料
型號(hào)： JANHCB2N2484
廠商： 意法半導(dǎo)體
英文描述： SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
中文描述： 半導(dǎo)體器件，晶體管，npn型，硅，低功耗類型2N2484，2N2484UA，2N2484UB 1月，JANTX，JANTXV，揚(yáng)斯，JANHC和JANKC
文件頁(yè)數(shù)： 14/19頁(yè)
文件大?。?/td> 113K
代理商： JANHCB2N2484
MIL-PRF-19500/376E
14
TABLE I. Group A inspection - Continued.
MIL-STD-750
Limit
Inspection 1/
Method
Conditions
Symbol
Min
Max
Unit
Subgroup 4 - continued.
Small-signal short- circuit
forward current transfer ratio
3206
V
= 5 V dc; I
C
= 1 mA dc;
f = 1 kHz
h
fe
250
900
Open circuit output
capacitance
3236
V
CB
= 5 V dc; I
E
= 0;
100 kHz
≤
f
≤
1 MHz
C
obo
5.0
pF
Input capacitance (output
open-circuited)
3240
V
EB
= 0.5 V dc; I
C
= 0;
100 kHz
≤
f
≤
1 MHz
C
ibo
6.0
pF
Noise figure
3246
f = 100 Hz; V
CE
= 5 V dc; I
C
= 10
μ
A dc; R
g
= 10 k
;
NF1
7.5
dB
Noise figure
3246
f = 1 kHz; V
CE
= 5 V dc; I
C
= 10
μ
A dc; R
g
= 10 k
;
NF2
3
dB
Noise figure
3246
f = 10 kHz; V
CE
= 5 V dc; I
C
= 10
μ
A dc; R
g
= 10 k
;
NF3
2
dB
Noise figure (wideband)
3246
Noise bandwidth = 10 Hz to 15.7
kHz; V
CE
= 5 V dc; I
C
= 10
μ
A dc;
R
g
= 10 k
;
NF4
3
dB
Subgroups 5 and 6
Not applicable
Subgroup 7 4/
Decap internal visual (design
verification)
2075
n = 1 device, c = 0
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A
failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
相關(guān)PDF資料
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