Specifications ispLSI 2096/A 4 USE ispLSI 2096E FOR NEW DESIGNS Switching Test Conditions Output Load Conditions (see Figure 2) Figure 2. Test " />
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    參數(shù)資料
    型號: ISPLSI 2096A-80LTN128I
    廠商: Lattice Semiconductor Corporation
    文件頁數(shù): 7/12頁
    文件大?。?/td> 0K
    描述: IC PLD ISP 96I/O 15NS 128TQFP
    標(biāo)準(zhǔn)包裝: 90
    系列: ispLSI® 2000A
    可編程類型: 系統(tǒng)內(nèi)可編程
    最大延遲時(shí)間 tpd(1): 15.0ns
    電壓電源 - 內(nèi)部: 4.5 V ~ 5.5 V
    邏輯元件/邏輯塊數(shù)目: 24
    宏單元數(shù): 96
    門數(shù): 4000
    輸入/輸出數(shù): 96
    工作溫度: -40°C ~ 85°C
    安裝類型: 表面貼裝
    封裝/外殼: 128-LQFP
    供應(yīng)商設(shè)備封裝: 128-TQFP(14x14)
    包裝: 托盤
    其它名稱: ISPLSI2096A-80LTN128I
    Specifications ispLSI 2096/A
    4
    USE
    ispLSI
    2096E
    FOR
    NEW
    DESIGNS
    Switching Test Conditions
    Output Load Conditions (see Figure 2)
    Figure 2. Test Load
    Input Pulse Levels
    Table 2-0003/2096
    Input Rise and Fall Time
    10% to 90%
    Input Timing Reference Levels
    Output Timing Reference Levels
    Output Load
    GND to 3.0V
    1.5V
    See Figure 2
    3-state levels are measured 0.5V from
    steady-state active level.
    ≤ 3 ns
    ≤ 2 ns
    Others
    -125
    TEST CONDITION
    R1
    R2
    CL
    A
    470Ω
    390Ω
    35pF
    B
    390Ω
    35pF
    470Ω
    390Ω
    35pF
    Active High
    Active Low
    C
    470Ω
    390Ω
    5pF
    390Ω
    5pF
    Active Low to Z
    at V +0.5V
    OL
    Active High to Z
    at V
    -0.5V
    OH
    Table 2-0004/2096
    DC Electrical Characteristics
    Over Recommended Operating Conditions
    + 5V
    R1
    R2
    CL*
    Device
    Output
    Test
    Point
    *CL includes Test Fixture and Probe Capacitance.
    0213/2096
    VOL
    SYMBOL
    1. One output at a time for a maximum duration of one second. V
    = 0.5V was selected to avoid test
    problems by tester ground degradation. Characterized but not 100% tested.
    2. Measured using six 16-bit counters.
    3. Typical values are at V = 5V and T = 25°C.
    4. Maximum I
    varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
    section of this data sheet and the Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
    estimate maximum I
    .
    Table 2-0007/2096
    1
    VOH
    IIH
    IIL
    IIL-isp
    PARAMETER
    IIL-PU
    IOS
    2, 4
    ICC
    Output Low Voltage
    Output High Voltage
    Input or I/O High Leakage Current
    Input or I/O Low Leakage Current
    ispEN Input Low Leakage Current
    I/O Active Pull-Up Current
    Output Short Circuit Current
    Operating Power Supply Current
    I = 8 mA
    I
    = -4 mA
    3.5V ≤ V ≤ V
    0V ≤ V ≤ V (Max.)
    0V ≤ V ≤ V
    V = 5V, V
    = 0.5V
    V = 0.0V, V = 3.0V
    f
    = 1 MHz
    OL
    OH
    IN
    IL
    IN
    CC
    IN
    IL
    IN
    IL
    CC
    OUT
    CLOCK
    IL
    IH
    CONDITION
    MIN.
    TYP.
    MAX.
    UNITS
    3
    2.4
    150
    0.4
    10
    -10
    -150
    -200
    295
    V
    μA
    mA
    CC
    A
    OUT
    CC
    Commercial
    Industrial
    Select
    devices
    have
    been
    discontinued.
    See
    Ordering
    Information
    section
    for
    product
    status.
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