
10
FN9217.0
September 21, 2005
If EN1 is brought high, and EN2 goes high before the VO1 
output stablizes, the ISL9000 delays the VO2 turn-on until 
the VO1 output reaches its target level. This minimizes input 
current surge due to concurrent turn-on. 
If EN2 is brought high, and EN1 goes high before the VO2 
output stablizes, the ISL9000 delays the VO1 turn-on until 
the VO2 output reaches its target level. 
If both EN1 and EN2 are brought high at the same time, the 
VO1 output has priority, and is always powered up first.
During operation, whenever the VIN voltage drops below 
about 1.8V, the ISL9000 immediately disables both LDO 
outputs. When VIN rises back above 2.1V, the device re-
initiates its start-up sequence and LDO operation will 
resume automatically.
Reference Generation
The reference generation circuitry includes a trimmed 
bandgap, a trimmed voltage reference divider, a trimmed 
current reference generator, and an RC noise filter. The filter 
includes the external capacitor connected to the CBYP pin. 
A 0.01
μ
F capacitor connected CBYP implements a 100Hz 
lowpass filter, and is recommended for most high 
performance applications. For the lowest noise application, a 
0.1
μ
F or greater CBYP capacitor should be used. This filters 
the reference noise to below the 10Hz – 1kHz frequency 
band, which is crucial in many noise-sensitive applications.
The bandgap generates a zero temperature coefficient (TC) 
voltage for the reference divider. The reference divider 
provides the regulation reference, POR detection thresholds, 
and other voltage references required for current generation 
and over-temperature detection. 
The current generator provides the references required for 
adaptive biasing as well as references for LDO output 
current limit and thermal shutdown determination.
LDO Regulation and Programmable Output Divider
The LDO Regulator is implemented with a high-gain 
operational amplifier driving a PMOS pass transistor. The 
design of the ISL9000 provides a regulator that has low 
quiescent current, fast transient response, and overall 
stability across all operating and load current conditions. 
LDO stability is guaranteed for a 1
μ
F to 10
μ
F output 
capacitor that has a tolerance better than 20% and ESR less 
than 200m
. The design is performance-optimized for a 1
μ
F 
capacitor. Unless limited by the application, use of an output 
capacitor value above 4.7
μ
F is not normally needed as LDO 
performance improvement is minimal. 
Each LDO uses an independently trimmed 1V reference. An 
internal resistor divider drops the LDO output voltage down 
to 1V. This is compared to the 1V reference for regulation. 
The resistor division ratio is programmed in the factory to 
one of the following output voltages: 1.5V, 1.8V, 1.85, 2.5V, 
2.6, 2.7, 2.8V, 2.85V, 2.9, 3.0, and 3.3V. 
Power On Reset Generation
Each LDO has a separate Power-on Reset signal generation 
circuit which outputs to the respective POR pins. The POR 
signal is generated as follows:
A POR comparator continuously monitors the output of each 
LDO. The LDO enters a power-good state when the output 
voltage is above 94% of the expected output voltage for a 
period exceeding the LDO PGOOD entry delay time (see 
below). In the power-good state, the open-drain PORx 
output is in a high-impedance state. An internal 100k
 pull-
up resistor pulls the pin up to the respective LDO output 
voltage. An external resistor can be added between the 
PORx output and the LDO output for a faster rise time, 
however, the PORx output should not connect through an 
external resistor to a supply greater than the associated 
LDO voltage. 
The power-good state is exited when the LDO output falls 
below 90% of the expected output voltage for a period longer 
than the PGOOD exit delay time. While power-good is false, 
the ISL9000 pulls the respective POR pin low.
For LDO-1, the PGOOD entry delay time is fixed at about 
2ms while the PGOOD exit delay is about 25
μ
s. For LDO-2, 
the PGOOD entry and exit delays are determined by the 
value of the external capacitor connected to the CPOR pin. 
For a 0.01
μ
F capacitor, the entry and exit delays are 200ms 
and 25
μ
s respectively. Larger or smaller capacitor values will 
yield proportionately longer or shorter delay times. The POR 
exit delay should never be allowed to be less than 10
μ
s to 
ensure sufficient immunity against transient induced false 
POR triggering. 
Overheat Detection
The bandgap provides a proportional-to-temperature current 
that is indicative of the temperature of the silicon. This 
current is compared with references to determine if the 
device is in danger of damage due to overheating. When the 
die temperature reaches about 145°C, one or both of the 
LDO’s momentarily shut down until the die cools sufficiently. 
In the overheat condition, only the LDO sourcing more than 
50mA will be shut off. This does not affect the operation of 
the other LDO. If both LDOs source more than 50mA and an 
overheat condition occurs, both LDO outputs are disabled. 
Once the die temperature falls back below about 110°C, the 
disabled LDO(s) are re-enabled and soft-start automatically 
takes place.
The ISL9000 provides short-circuit protection by limiting the 
output current to about 475mA. If short circuited, an output 
current of 475mA will cause die heating. If the short circuit 
lasts long enough, the overheat detection circuit will turn off 
the output.
ISL9000