參數(shù)資料
型號(hào): ISL83239EIA
廠商: INTERSIL CORP
元件分類: 通用總線功能
英文描述: 【15kV ESD Protected, 10nA Supply- Current, 3V to +5.5V, 250kbps, RS-232 Transmitters/Receivers
中文描述: TRIPLE LINE TRANSCEIVER, PDSO28
封裝: PLASTIC, MO-150-AH, SSOP-28
文件頁數(shù): 8/12頁
文件大?。?/td> 567K
代理商: ISL83239EIA
8
all transmitters were simultaneously driving RS-232 loads in
parallel with 1000pF, at 120kbps. Figure 7 shows the
loopback results for a single transmitter driving 1000pF and
an RS-232 load at 250kbps. The static transmitters were
also loaded with an RS-232 receiver.
Interconnection with 3V and 5V Logic
The ISL83239E directly interfaces with 5V CMOS and TTL
logic families. Nevertheless, with the device at 3.3V, and the
logic supply at 5V, AC, HC, and CD4000 outputs can drive
ISL83239E inputs, but ISL83239E outputs do not reach the
minimum V
IH
for these logic families. See Table 4 for more
information.
±
15kV ESD Protection
All pins on ISL832XX devices include ESD protection
structures, but the ISL83239
E
fsincorporates advanced
structures which allow the RS-232 pins (transmitter outputs
and receiver inputs) to survive ESD events up to
±
15kV. The
RS-232 pins are particularly vulnerable to ESD damage
because they typically connect to an exposed port on the
exterior of the finished product. Simply touching the port
pins, or connecting a cable, can cause an ESD event that
might destroy unprotected ICs. These new ESD structures
protect the device whether or not it is powered up, protect
without allowing any latchup mechanism to activate, and
don’t interfere with RS-232 signals as large as
±
25V.
Human Body Model (HBM) Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge through a 1.5k
current limiting resistor,
making the test less severe than the IEC-1000 test which
utilizes a 330
limiting resistor. The HBM method
determines an ICs ability to withstand the ESD transients
typically present during handling and manufacturing. Due to
the random nature of these events, each pin is tested with
respect to all other pins. The RS-232 pins on “E” family
devices can withstand HBM ESD events to
±
15kV.
IEC1000-4-2 Testing
The IEC 1000 test method applies to finished equipment,
rather than to an individual IC. Therefore, the pins most likely
to suffer an ESD event are those that are exposed to the
outside world (the RS-232 pins in this case), and the IC is
tested in its typical application configuration (power applied)
rather than testing each pin-to-pin combination. The lower
FIGURE 5. TRANSMITTER LOOPBACK TEST CIRCUIT
FIGURE 6. LOOPBACK TEST AT 120kbps
FIGURE 7. LOOPBACK TEST AT 250kbps
ISL83239E
V
CC
C
1
C
2
C
4
+
C
3
+
+
+
C
L
V+
V-
5k
T
IN
R
OUT
C1+
C1-
C2+
C2-
R
IN
T
OUT
+
V
CC
0.1
μ
F
V
CC
SHDN
T1
IN
T1
OUT
R1
OUT
5
μ
s/DIV.
V
CC
= +3.3V
C1 - C4 = 0.1
μ
F
5V/DIV.
T1
IN
T1
OUT
R1
OUT
2
μ
s/DIV.
5V/DIV.
V
CC
= +3.3V
C1 - C4 = 0.1
μ
F
TABLE 4. LOGIC FAMILY COMPATIBILITY WITH VARIOUS
SUPPLY VOLTAGES
SYSTEM
POWER-SUPPLY
VOLTAGE
(V)
V
CC
SUPPLY
VOLTAGE
(V)
COMPATIBILITY
3.3
3.3
Compatible with all CMOS
families.
5
5
Compatible with all TTL and
CMOS logic families.
5
3.3
Compatible with ACT and HCT
CMOS, and with TTL.
ISL83239E
outputs are
incompatible with AC, HC, and
CD4000 CMOS inputs.
ISL83239E
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