參數(shù)資料
型號: IR2110-2
英文描述: MOSFET Driver
中文描述: MOSFET驅(qū)動器
文件頁數(shù): 3/15頁
文件大?。?/td> 275K
代理商: IR2110-2
3
IR2110/IR2113
www.irf.com
Symbol
V
IH
V
IL
V
OH
V
OL
I
LK
I
QBS
I
QCC
I
QDD
I
IN+
I
IN-
V
BSUV+
Definition
Figure Min.
12
Typ. Max. Units Test Conditions
Logic “1” input voltage
9.5
Logic “0” input voltage
13
6.0
High level output voltage, V
BIAS
- V
O
Low level output voltage, V
O
Offset supply leakage current
14
1.2
I
O
= 0A
I
O
= 0A
15
0.1
16
50
V
B
=V
S
= 500V/600V
V
IN
= 0V or V
DD
V
IN
= 0V or V
DD
V
IN
= 0V or V
DD
V
IN
= V
DD
V
IN
= 0V
Quiescent V
BS
supply current
Quiescent V
CC
supply current
Quiescent V
DD
supply current
Logic “1” input bias current
17
125
230
18
180
340
19
15
30
20
20
40
Logic “0” input bias current
V
BS
supply undervoltage positive going
threshold
V
BS
supply undervoltage negative going
threshold
V
CC
supply undervoltage positive going
threshold
V
CC
supply undervoltage negative going
threshold
Output high short circuit pulsed current
21
22
7.5
8.6
1.0
9.7
V
BSUV-
23
7.0
8.2
9.4
V
CCUV+
24
7.4
8.5
9.6
V
CCUV-
25
7.0
8.2
9.4
I
O+
26
2.0
2.5
V
O
= 0V, V
IN
= V
DD
PW
10 μs
V
O
= 15V, V
IN
= 0V
PW
10 μs
I
O-
Output low short circuit pulsed current
27
2.0
2.5
Static Electrical Characteristics
V
BIAS
(V
CC
, V
BS
, V
DD
) = 15V, T
A
= 25°C and V
SS
= COM
unless otherwise specified. The V
IN
, V
TH
and I
IN
parameters
are referenced to V
SS
and are applicable to all three logic input leads: HIN, LIN and SD. The V
O
and I
O
parameters are
referenced to COM and are applicable to the respective output leads: HO or LO.
V
μA
V
A
Symbol
t
on
t
off
t
sd
t
r
t
f
MT
Definition
Figure Min.
7
Typ. Max. Units Test Conditions
120
150
Turn-on propagation delay
V
S
= 0V
Turn-off propagation delay
8
94
125
V
S
= 500V/600V
V
S
= 500V/600V
Shutdown propagation delay
9
110
140
Turn-on rise time
10
25
35
Turn-off fall time
11
17
25
Delay matching, HS & LS turn-on/off
10
Figure 5
ns
Dynamic Electrical Characteristics
V
BIAS
(V
CC
, V
BS
, V
DD
) = 15V, C
L
= 1000 pF, T
A
= 25°C and V
SS
= COM unless otherwise specified. The dynamic
electrical characteristics are measured using the test circuit shown in Figure 3.
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