參數(shù)資料
型號(hào): INA271AIDRG4
英文描述: Voltage Output, Unidirectional Measurement Current-Shunt Monitor
中文描述: 電壓輸出,單向測(cè)量電流并聯(lián)監(jiān)視器
文件頁(yè)數(shù): 2/17頁(yè)
文件大?。?/td> 360K
代理商: INA271AIDRG4
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
PIN CONFIGURATION
1
2
3
4
8
7
6
5
IN+
NC
(1)
V+
OUT
IN
-
GND
PRE OUT
BUF IN
INA27x
INA270
INA271
SBOS381A–FEBRUARY 2007–REVISED APRIL 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
PACKAGE
DESIGNATOR
D
D
PACKAGE
MARKING
I270A
I271A
PRODUCT
INA270
INA271
PACKAGE-LEAD
SO-8
SO-8
GAIN
14
20
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at
www.ti.com
.
INA270, INA271
+18
UNIT
V
Supply Voltage (V
S
)
Analog Inputs, V
IN+
, V
IN–
:
Differential, (V
IN+
) – (V
IN–
)
Common-Mode
Analog Output:
OUT and PRE OUT Pins
Input Current Into Any Pin
Operating Temperature
Storage Temperature
Junction Temperature
ESD Ratings:
Human Body Model
Charged-Device Model
–18 to +18
–16 to +80
V
V
GND – 0.3 to (V+) + 0.3
5
–55 to +150
–65 to +150
+150
V
mA
°
C
°
C
°
C
3000
750
V
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
SO-8
Top View
NOTE (1): NC denotes no internal connection.
2
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