
INDUSTRIALTEMPERATURERANGE
2
IDT74FCT821AT/CT
HIGH-PERFORMANCECMOSBUSINTERFACEREGISTER
PIN CONFIGURATION
SOIC/ QSOP
TOP VIEW
2
3
1
20
19
18
15
16
9
10
D6
D7
D2
D5
D3
D4
D8
23
22
24
21
17
5
6
7
4
8
D0
VCC
CP
OE
13
14
11
12
D1
GND
D9
Y6
Y7
Y2
Y5
Y3
Y4
Y8
Y0
Y1
Y9
Pin Name
I/O
Description
Dx
I
D Flip-Flop Data Inputs
CLR
I
When the clear input is LOW and
OE is LOW, the
Qx outputs are LOW. When the clear input is HIGH,
data can be entered into the register.
C P
I
Clock Pulse for the Register. Enters data into the
register on the LOW-to-HIGH transition
Y x
O
Register 3-State Outputs
EN
I
Clock Enable. When the clock enable is LOW, data
on the Dx input is transferred to the Qx input on the
LOW-to-HIGH transition. When the clock enable is
HIGH, the Qx inputs do not change state, regardless
of the data or clock input transitions.
OE
I
Output Control. When the
OE input is HIGH, the Yx
outputs are in the high impedance state. When the
OE input is LOW, the TRUE register data is present
at the Yx outputs.
PIN DESCRIPTION
Symbol
Description
Max
Unit
VTERM(2)
Terminal Voltage with Respect to GND
–0.5 to +7
V
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
TSTG
Storage Temperature
–65 to +150
° C
IOUT
DC Output Current
–60 to +120
mA
ABSOLUTE MAXIMUM RATINGS(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
Symbol
Parameter
(1)
Conditions
Typ.
Max.
Unit
CIN
Input Capacitance
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
CAPACITANCE (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.