參數(shù)資料
型號(hào): IDT72T3695L5BBI
廠商: IDT, Integrated Device Technology Inc
文件頁(yè)數(shù): 26/57頁(yè)
文件大?。?/td> 0K
描述: IC FIFO 32768X36 5NS 208BGA
標(biāo)準(zhǔn)包裝: 1
系列: 72T
功能: 異步,同步
存儲(chǔ)容量: 1.1M(32K x 36)
數(shù)據(jù)速率: 83MHz
訪問(wèn)時(shí)間: 5ns
電源電壓: 2.375 V ~ 2.625 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 208-BGA
供應(yīng)商設(shè)備封裝: 208-PBGA(17x17)
包裝: 托盤
其它名稱: 72T3695L5BBI
32
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72T3645/55/65/75/85/95/105/115/125 2.5V TeraSync
36-BIT FIFO
1K x 36, 2K x 36, 4K x 36, 8K x 36, 16K x 36, 32K x 36, 64K x 36, 128K x 36 and 256K x 36
FEBRUARY 4, 2009
JTAG INTERFACE
Five additional pins (TDI, TDO, TMS, TCK and
TRST) are provided to
support the JTAG boundary scan interface. The IDT72T3645/72T3655/
72T3665/72T3675/72T3685/72T3695/72T36105/72T36115/72T36125 in-
corporatesthenecessarytapcontrollerandmodifiedpadcellstoimplementthe
JTAG facility.
Note that IDT provides appropriate Boundary Scan Description Language
program files for these devices.
The Standard JTAG interface consists of four basic elements:
Test Access Port (TAP)
TAP controller
Instruction Register (IR)
Data Register Port (DR)
The following sections provide a brief description of each element. For a
completedescriptionrefertotheIEEEStandardTestAccessPortSpecification
(IEEE Std. 1149.1-1990).
The Figure below shows the standard Boundary-Scan Architecture
Figure 7. Boundary Scan Architecture
TEST ACCESS PORT (TAP)
The Tap interface is a general-purpose port that provides access to the
internaloftheprocessor. Itconsistsoffourinputports(TCLK,TMS,TDI,
TRST)
and one output port (TDO).
THE TAP CONTROLLER
The Tap controller is a synchronous finite state machine that responds to
TMS and TCLK signals to generate clock and control signals to the Instruction
and Data Registers for capture and update of data.
T
A
P
TAP
Cont-
roller
Mux
DeviceID Reg.
Boundary Scan Reg.
Bypass Reg.
clkDR, ShiftDR
UpdateDR
TDO
TDI
TMS
TCLK
TRST
clklR, ShiftlR
UpdatelR
Instruction Register
Instruction Decode
Control Signals
5907 drw12
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