- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄377249 > IDT6178S25PB (Integrated Device Technology, Inc.) CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM PDF資料下載
參數(shù)資料
| 型號： | IDT6178S25PB |
| 廠商： | Integrated Device Technology, Inc. |
| 英文描述： | CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM |
| 中文描述： | 的CMOS StaticRAM 16K的（4K的× 4位）高速緩存標記內(nèi)存 |
| 文件頁數(shù)： | 3/7頁 |
| 文件大?。?/td> | 72K |
| 代理商： | IDT6178S25PB |
11.1
3
IDT6178S
CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS
(V
CC
= 5.0V
±
10%, All Temperature Ranges)
6178S
Symbol
|I
LI
|
|I
LO
|
V
OL
Parameter
Test Condition
V
CC
= 5.5V, V
IN
= 0V to V
CC
OE
= V
IH
, V
OUT
= 0V to V
CC
I
OL
= 8mA (I/O
0
– I/O
3
)
I
OL
= 10mA (I/O
0
– I/O
3
)
I
OL
= 16mA (Match)
I
OL
= 20mA (Match)
I
OH
= –4mA (I/O
0
– I/O
3
)
I
OH
= –8mA (Match)
Min.
—
—
—
—
—
—
2.4
2.4
Max.
10
10
0.4
0.5
0.4
0.5
—
—
Unit
μ
A
μ
A
V
V
V
V
V
V
Input Leakage Current
Output Leakage Current
Output Low Voltage
V
OH
Output High Voltage
2953 tbl 07
Figure 3. AC Test Load
(for t
OLZ
, t
OHZ
, t
WHZ
, t
OW
)
* Including scope and jig.
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
AC Test Load for Match Cycle
GND to 3.0V
5ns
1.5V
1.5V
See Figures 2 and 3
See Figure 1
2953 tbl 09
480
5pF*
255
+5V
2953 drw 06
DATA
OUT
240
30pF*
128
+5V
2953 drw 04
MATCH
OUT
Figure 1. AC Test Load for MATCH
DC ELECTRICAL CHARACTERISTICS
(V
CC
= 5.0V
±
10%, All Temperature Ranges)
6178S10
Max.
6178S12
(1)
Max.
6178S15
(1)
Max.
6178S20/25
Max.
Symbol
Parameter
Unit
I
CC1
Operating Power Supply Current
Outputs Open, V
CC
= Max., f = 0
(2)
Dynamic Operating Current
Outputs Open, V
CC
= Max., f = f
MAX
(2)
MIL.
COM'L.
MIL.
COM'L.
90
—
180
—
90
110
160
180
90
110
140
160
90
110
140
160
mA
mA
mA
mA
I
CC2
NOTES:
1.
Military values are preliminary only.
2.
f
MAX
= 1/t
RC
, only address inputs are cycling at f
MAX
. f = 0 means no address inputs change.
2953 tbl 08
480
30pF*
255
+5V
2953 drw 05
DATA
OUT
Figure 2. AC Test Load
相關PDF資料 |
PDF描述 |
|---|---|
| IDT6178S25Y | CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM |
| IDT6178S | CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM |
| IDT6178S15D | Low-Power JFET-Input Operational Amplifier 8-PDIP 0 to 70 |
| IDT6178S15DB | Low-Power JFET-Input Operational Amplifier 8-PDIP 0 to 70 |
| IDT6178S15P | Dual Low-Power JFET-Input General-Purpose Operational Amplifier 8-SOIC 0 to 70 |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| IDT6178S25Y | 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM |
| IDT6178S25YB | 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM |
| IDT61970L20D | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x4 SRAM |
| IDT61970L20DB | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x4 SRAM |
| IDT61970L20P | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x4 SRAM |
發(fā)布緊急采購，3分鐘左右您將得到回復。